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	Investigation on semiconductor test scheduling
	Zhang Zhicong ; Zheng Li ; Zhang Tao
	2010-05-10 ; 2010-05-10
关键词	Practical/ production control scheduling semiconductor device testing/ semiconductor test scheduling multiproduct production process semiconductor product tester-handler-enabler combination parallel machine scheduling problems sequence-dependant setup times/ B0170E Production facilities and engineering B2560 Semiconductor devices B0170C Project and design engineering B0170S Control equipment and processes in production engineering E3644A Semiconductor industry E1010 Production management
中文摘要	Semiconductor test is a capital intensive multi-product production process with complicated testing resources. To test a semiconductor product, a tester, a handler and an enabler are simultaneously in need. The relationship of product and qualified tester-handler-enabler combination is very complicated. Most semiconductor test problems are multiple resources constrained unrelated parallel machine scheduling problems with consideration of sequence-dependant setup times. A survey on semiconductor test scheduling respectively from the point of view of problem category and methodology were given. The semiconductor test scheduling problems were analyzed by two categories: without and with simultaneous resources constraint. The scheduling methods in literature were summarized and their characteristics were discussed by comparison.
语种	中文 ; 中文
出版者	Editorial Board of Semiconductor Technology ; China
内容类型	期刊论文
源URL	[http://hdl.handle.net/123456789/23690]
专题	清华大学
推荐引用方式 GB/T 7714	Zhang Zhicong,Zheng Li,Zhang Tao. Investigation on semiconductor test scheduling[J],2010, 2010.
APA	Zhang Zhicong,Zheng Li,&Zhang Tao.(2010).Investigation on semiconductor test scheduling..
MLA	Zhang Zhicong,et al."Investigation on semiconductor test scheduling".(2010).

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