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	Refraction-angle resolution of diffraction enhanced imaging
	Huang, Zhi-Feng ; Kang, Ke-Jun ; Li, Zheng
	2010-05-10 ; 2010-05-10
关键词	PHASE-CONTRAST COMPUTED-TOMOGRAPHY ANALYZER CRYSTALS Engineering, Biomedical Radiology, Nuclear Medicine & Medical Imaging
中文摘要	As a new method, x-ray diffraction enhanced imaging (DEI) has extremely high sensitivity for weakly absorbing low-Z samples in medical and biological fields. Conventional performance parameters, such as spatial resolution and low-contrast resolution, are not enough to describe the characteristics of a DEI system. This paper focuses on refraction-angle resolution which describes the ability of a DEI system to differentiate the x-rays refracted by the sample. The analysis of refraction-angle resolution is composed of two parts: the analysis of the single DEI image measured in a certain position of the rocking curve and the analysis of the refraction-angle image calculated by extraction methods. A 2D computer simulation experiment is performed to prove the results of the analyses. The limitations and conclusions of refraction-angle resolution are described in the end.
语种	英语 ; 英语
出版者	IOP PUBLISHING LTD ; BRISTOL ; DIRAC HOUSE, TEMPLE BACK, BRISTOL BS1 6BE, ENGLAND
内容类型	期刊论文
源URL	[http://hdl.handle.net/123456789/22389]
专题	清华大学
推荐引用方式 GB/T 7714	Huang, Zhi-Feng,Kang, Ke-Jun,Li, Zheng. Refraction-angle resolution of diffraction enhanced imaging[J],2010, 2010.
APA	Huang, Zhi-Feng,Kang, Ke-Jun,&Li, Zheng.(2010).Refraction-angle resolution of diffraction enhanced imaging..
MLA	Huang, Zhi-Feng,et al."Refraction-angle resolution of diffraction enhanced imaging".(2010).

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