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Nickel-induced enhancement of photoluminescence from Si-rich silica films
He, Y ; Ma, K ; Bi, L ; Feng, JY ; Zhang, ZJ
2010-05-10 ; 2010-05-10
关键词POROUS SILICON OPTICAL-PROPERTIES ROOM-TEMPERATURE NANOCRYSTALS LUMINESCENCE EMISSION LAYERS Physics, Applied
中文摘要The effect of Ni on the near-infrared luminescence emitting from silicon nanocrystals embedded in SiO2 matrix has been investigated. According to the thermodynamics calculation, nickel can give additional driving force to the phase separation process. The photoluminescence intensity increases with the increasing annealing temperature because of the crystallization of amorphous silicon in SiOx films. The intensity of near-infrared emission of SiO1.56/Ni/Si is stronger by a factor of 5 than that of regular specimen after annealing at 1000 or 1100 degrees C due to the increase of the density of Si nanocrystals. (c) 2006 American Institute of Physics.
语种英语 ; 英语
出版者AMER INST PHYSICS ; MELVILLE ; CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1, MELVILLE, NY 11747-4501 USA
内容类型期刊论文
源URL[http://hdl.handle.net/123456789/21639]  
专题清华大学
推荐引用方式
GB/T 7714
He, Y,Ma, K,Bi, L,et al. Nickel-induced enhancement of photoluminescence from Si-rich silica films[J],2010, 2010.
APA He, Y,Ma, K,Bi, L,Feng, JY,&Zhang, ZJ.(2010).Nickel-induced enhancement of photoluminescence from Si-rich silica films..
MLA He, Y,et al."Nickel-induced enhancement of photoluminescence from Si-rich silica films".(2010).
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