| EELS study on BST thin film under electron beam irradiation | |
| Rao, J ; Zhu, J | |
| 2010-05-10 ; 2010-05-10 | |
| 关键词 | BST thin film irradiation damage EELS ENERGY-LOSS SPECTROSCOPY GRAIN-BOUNDARIES TITANIUM NONSTOICHIOMETRY CHEMISTRY OXIDES Engineering, Multidisciplinary Materials Science, Multidisciplinary |
| 中文摘要 | It was found that BST thin film was damaged by the irradiation of high density electron beam (the current density was about 2 nA/cm(2)). In-situ and real time EELS showed that the intensity ratio of Ti to O edge and the distance between Ti and O edge changed. It indicated that the film lost oxygen and thus the oxidation states of positive ions lowered. EELS study with high spatial resolution proved that compared with the inner of columnar grains, the grain boundaries with special structure and chemical environment were the main passageway of oxygen loss. |
| 语种 | 英语 ; 英语 |
| 出版者 | SCIENCE CHINA PRESS ; BEIJING ; 16 DONGHUANGCHENGGEN NORTH ST, BEIJING 100717, PEOPLES R CHINA |
| 内容类型 | 期刊论文 |
| 源URL | [http://hdl.handle.net/123456789/21609]  |
| 专题 | 清华大学 |
| 推荐引用方式 GB/T 7714 | Rao, J,Zhu, J. EELS study on BST thin film under electron beam irradiation[J],2010, 2010. |
| APA | Rao, J,&Zhu, J.(2010).EELS study on BST thin film under electron beam irradiation.. |
| MLA | Rao, J,et al."EELS study on BST thin film under electron beam irradiation".(2010). |
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