Effect of post-annealing in oxygen atmosphere on the photoluminescence properties of nc-Si rich SiO2 films | |
Bi, L ; He, Y ; Feng, JY | |
2010-05-10 ; 2010-05-10 | |
关键词 | interfaces low-dimensional structures physical vapor deposition process nanomaterials semiconducting materials SILICON NANOCRYSTALS VISIBLE PHOTOLUMINESCENCE LUMINESCENCE CONFINEMENT OXIDATION Crystallography |
中文摘要 | In this study, Si-rich silicon oxide (SiO1.56) films are fabricated by reactive sputtering and subsequently annealed at high temperature in N-2 or Ar atmosphere. High-resolution transmission electron microscopy (HRTEM) and Raman spectrum confirms the formation of silicon nanocrystals (nc-Si). After the first step annealing process, oxygen is introduced as a post-annealing atmosphere. It has been observed that the photoluminescence properties of the films change dramatically due to the post-annealing, and the variation differs depending on the first-step annealing atmosphere. The mechanism of this phenomenon has been discussed and it has been concluded that the post-annealing mainly serves as both a passivation and an oxidation process at the nanocrystal interface. Oxygen is considered to be a more stable passivating atmosphere for SiOx films annealed in N-2 at high temperatures instead of H-2. (c) 2005 Elsevier B.V. All rights reserved. |
语种 | 英语 ; 英语 |
出版者 | ELSEVIER SCIENCE BV ; AMSTERDAM ; PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS |
内容类型 | 期刊论文 |
源URL | [http://hdl.handle.net/123456789/21544] ![]() |
专题 | 清华大学 |
推荐引用方式 GB/T 7714 | Bi, L,He, Y,Feng, JY. Effect of post-annealing in oxygen atmosphere on the photoluminescence properties of nc-Si rich SiO2 films[J],2010, 2010. |
APA | Bi, L,He, Y,&Feng, JY.(2010).Effect of post-annealing in oxygen atmosphere on the photoluminescence properties of nc-Si rich SiO2 films.. |
MLA | Bi, L,et al."Effect of post-annealing in oxygen atmosphere on the photoluminescence properties of nc-Si rich SiO2 films".(2010). |
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