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	Structure and magnetic properties of Co/sub 80/Cr/sub 20//Ti/sub 90/Cr/sub 10/ film prepared by pulsed-laser deposition
	Zeng Fan-Hao ; Zhang Xiao-Zhong
	2010-05-10 ; 2010-05-10
关键词	Experimental/ adhesion chromium alloys cobalt alloys coercive force crystal structure grain size hardness interface magnetism lattice constants magnetic thin films pulsed laser deposition surface morphology titanium alloys transmission electron microscopy X-ray diffraction/ magnetic properties pulsed-laser deposition thin films crystal structure XRD amorphous state grain size lattice parameters surface morphology cross-sectional morphology TEM hardness adhesion strength nanoindenter VSM coercivity magnetization 600 C 8 nm 14 nm Co/sub 80/Cr/sub 20/-Ti/sub 90/Cr/sub 10/-Si Si/ A6855 Thin film growth, structure, and epitaxy A8115I Pulsed laser deposition A6860 Physical properties of thin films, nonelectronic A6820 Solid surface structure A6220M Fatigue, brittleness, fracture, and cracks A8140N Fatigue, embrittlement, and fracture A7560E Magnetization curves, hysteresis, Barkhausen and related effects A7570C Interfacial magnetic properties/ temperature 8.73E+02 K size 8.0E-09 m size 1.4E-08 m/ Co80Cr20-Ti90Cr10-Si/int Co80Cr20/int Ti90Cr10/int Co80/int Cr10/int Cr20/int Ti90/int Co/int Cr/int Si/int Ti/int Co80Cr20/bin Ti90Cr10/bin Co80/bin Cr10/bin Cr20/bin Ti90/bin Co/bin Cr/bin Ti/bin Si/el Si/sur Si/el
中文摘要	Ti/sub 90/Cr/sub 10/ and Co/sub 80/Cr/sub 20//Ti/sub 90/Cr/sub 10/ thin films were prepared by pulsed laser deposition on Si (100) substrate at various temperatures. The relations between crystal structure and substrate temperature were investigated by XRD and the result revealed that as the substrate temperature increased, the film changed from amorphous state to crystal state gradually. Furthermore, the grain size and lattice parameters of Ti/sub 90/Cr/sub 10/ film were measured by the XRD spectrum. The surface and cross-sectional morphology of Ti/sub 90/Cr/sub 10/ film were characterized by TEM. The hardness, as well as boundary adhesion strength of the Ti/sub 90/Cr /sub 10/ film was measured by nano-indenter and the result indicates that increase of the substrate temperature is beneficial to increasing the adhesion of the film. The magnetic properties of Co/sub 80/Cr/sub 20//Ti/sub 90/Cr/sub 10/ film were studied by VSM and the coercivity was observed to increase with decreasing film thickness. For the Co/sub 80/Cr/sub 20/ (8 nm)/Ti/sub 90/Cr/sub 10/ (14 nm) film prepared at substrate temperature of 600 degrees C in vacuum, its coercivity is 65.25 kA/m and the squareness is about 0.86. Finally, the magnetization properties of the Co/sub 80/Cr/sub 20//Ti/sub 90/Cr/sub 10/ are also discussed.
语种	中文 ; 中文
出版者	Chinese Phys. Soc ; China
内容类型	期刊论文
源URL	[http://hdl.handle.net/123456789/20852]
专题	清华大学
推荐引用方式 GB/T 7714	Zeng Fan-Hao,Zhang Xiao-Zhong. Structure and magnetic properties of Co/sub 80/Cr/sub 20//Ti/sub 90/Cr/sub 10/ film prepared by pulsed-laser deposition[J],2010, 2010.
APA	Zeng Fan-Hao,&Zhang Xiao-Zhong.(2010).Structure and magnetic properties of Co/sub 80/Cr/sub 20//Ti/sub 90/Cr/sub 10/ film prepared by pulsed-laser deposition..
MLA	Zeng Fan-Hao,et al."Structure and magnetic properties of Co/sub 80/Cr/sub 20//Ti/sub 90/Cr/sub 10/ film prepared by pulsed-laser deposition".(2010).

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