QQ客服 官方微博 反馈留言

	Equipment for 2-D profile measuring of aspheric microscope condenser in mass production - art. no. 68343L
	Cheng, Xuemin ; Ma, Jianshe ; Zhang, Yi
	2010-05-10 ; 2010-05-10
会议名称	OPTICAL DESIGN AND TESTING III, PTS 1 AND 2 ; Conference on Optical Design and Testing III ; Beijing, PEOPLES R CHINA ; Web of Science
关键词	aspheric condenser optical measurement interpolation SURFACES Optics
中文摘要	This paper deals with the measurement of aspherics on surfaces of microscope condenser in mass production. The aspheric surface in microscope condenser is a kind of optical surface working under very large numerical aperture and small field of view. To fulfill Kohler illumination for the microscope condenser, the aspheric surface must be fabricated as well as designed capable of projecting an image of the source, large enough to fill the sub stage condenser of the microscope. For larger numerical aperture condenser fabrication, it is crucial to guarantee a reasonable aspheric profile for spherical aberration compensation and even illumination. Here we established the equipment for microscope condenser aspheric profile measuring in mass production. The industry microscope is reconstructed to image the profile, with LED panel light source for even backlighting. The profile, captured with a high resolution CCD, is processed. It can be compared with theoretic aspheric profile directly or interpolated with a predefined polynomial. In this method, supports for aspheric lens fabrication and measurement are designed and employed on the industry microscope. It guaranteed that a table of points can accurately describe the profile of the aspheric surface, introducing less assembling error. Measurement with this method has proved satisfactory for certain high aperture microscope condenser at low cost. For systems requiring still higher accuracy, the CCD resolution may have to be increased and interpolation method optimized accordingly but the online aspheric testing equipment with proper supports could surely improve the accuracy of aspheric surface fabrication at low cost.
会议录出版者	SPIE-INT SOC OPTICAL ENGINEERING ; BELLINGHAM ; 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA
语种	英语 ; 英语
内容类型	会议论文
源URL	[http://hdl.handle.net/123456789/19995]
专题	清华大学
推荐引用方式 GB/T 7714	Cheng, Xuemin,Ma, Jianshe,Zhang, Yi. Equipment for 2-D profile measuring of aspheric microscope condenser in mass production - art. no. 68343L[C]. 见:OPTICAL DESIGN AND TESTING III, PTS 1 AND 2, Conference on Optical Design and Testing III, Beijing, PEOPLES R CHINA, Web of Science.

个性服务

查看访问统计

相关权益政策

暂无数据

收藏/分享

除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。