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Study on active probe laser system used for laser plasma diagnostic
Xiaodong Yuan ; Xiaofeng Wei ; Chengcheng Wang ; Xinwu Qing ; Wu Deng ; Bin Xu ; Dongbin Jiang ; Jun Tang ; Huaiting Jia
2010-05-10 ; 2010-05-10
会议名称Proceedings of the SPIE - The International Society for Optical Engineering ; ECLIM 2002: 27th European Conference on Laser Interaction with Matter ; , Russia ; INSPEC
关键词Experimental/ plasma density plasma diagnostics plasma light propagation plasma temperature/ laser plasma diagnostic electron temperature electron density XG-II laser facility UV probe laser cascade Raman compressor harmonic conversion Thomson scattering system 30 ps 3 to 5 J/ A5270K Optical (ultraviolet, visible, infrared) plasma diagnostic techniques A5240D Electromagnetic wave propagation in plasma A5225L Plasma temperature and density A5225P Emission, absorption, and scattering of radiation in plasma/ time 3.0E-11 s energy 3.0E+00 to 5.0E+00 J
中文摘要To measure the temperature and density of electronics in laser plasma accurately, two probe laser systems are built on XG-II laser facility. The one, called UV probe laser system, which can provide the UV laser pulse with duration of 30 ps by cascade Raman compressor after fourth harmonic conversion is used for density measurement of laser plasma. The other one, Thomson scattering system, which can provide the 4 omega laser pulse with energy of 3 5J, is now routinely operated for electronics temperature diagnostic in laser plasma. It is the first time that the density and temperature of laser plasma are measured directly by probe laser at the same shot.
会议录出版者SPIE-Int. Soc. Opt. Eng ; USA
语种英语 ; 英语
内容类型会议论文
源URL[http://hdl.handle.net/123456789/19506]  
专题清华大学
推荐引用方式
GB/T 7714
Xiaodong Yuan,Xiaofeng Wei,Chengcheng Wang,et al. Study on active probe laser system used for laser plasma diagnostic[C]. 见:Proceedings of the SPIE - The International Society for Optical Engineering, ECLIM 2002: 27th European Conference on Laser Interaction with Matter, , Russia, INSPEC.
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