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	Near field Raman spectral measurement of monocrystalline silicon by apertureless SNOM in reflection geometry
	Wu, XB ; Yang, W ; Jia, W ; Tian, Q ; Yu, JY
	2010-05-10 ; 2010-05-10
会议名称	Nanophotonics, Nanostructure, and Nanometrology ; Conference on Nanophotonics, Nanostructure and Nanometrology ; Beijing, PEOPLES R CHINA ; Web of Science ; INSPEC
关键词	near field optics apertureless SNOM near field Raman spectroscopy SCANNING OPTICAL MICROSCOPY SPECTROSCOPY TIP PROBE Instruments & Instrumentation Optics
中文摘要	The combination of scanning near field optical microscopy (SNOM) and Raman spectroscopy provides specific spectra information with nanometer spatial resolution beyond the diffraction limit, which has a wide range of potential applications and can help to understand the interactions between light and matter in nanometer scale. In this paper, a near-field Raman spectroscopy experimental setup has been developed by using an apertureless SNOM system. An Ar+ laser (514nm) is focused at an angle onto the sample surface. The metallized tip is an Au-layer-coated cantilever of an atomic force microscopy and working in the contact mode. The near field Raman spectra signal can be detected when the tip approached the sample surface. In addition, the apertureless SNOM appears to have greater potential resolution than aperture-type SNOM system. Furthermore, the reflection geometry employed in this experiment allows no need for specific sample preparation, making near field spectrum study a reality for any samples. The reflected near field Raman spectra signal is collected by a microscope objective. Finally, the near field Raman spectra of monocrystalline silicon are presented.
会议录出版者	SPIE-INT SOC OPTICAL ENGINEERING ; BELLINGHAM ; 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA
语种	英语 ; 英语
内容类型	会议论文
源URL	[http://hdl.handle.net/123456789/19501]
专题	清华大学
推荐引用方式 GB/T 7714	Wu, XB,Yang, W,Jia, W,et al. Near field Raman spectral measurement of monocrystalline silicon by apertureless SNOM in reflection geometry[C]. 见:Nanophotonics, Nanostructure, and Nanometrology, Conference on Nanophotonics, Nanostructure and Nanometrology, Beijing, PEOPLES R CHINA, Web of Science, INSPEC.

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