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	PRML detection of multi-level run-length limited DVD system
	Hua Hu ; Longfa Pan ; Yi Ni
	2010-05-10 ; 2010-05-10
会议名称	Proceedings of the SPIE - The International Society for Optical Engineering ; Quantum Optics, Optical Data Storage, and Advanced Microlithography ; Beijing, China ; INSPEC
关键词	Theoretical or Mathematical Experimental/ digital versatile discs maximum likelihood detection partial response channels read-only storage runlength codes/ PRML detection multilevel run-length limited DVD system multilevel optical recording four-level RLL modulation read-only digital versatile discs DVD-ROM DC-free 4-level RLL code partial response maximum-likelihood detector multilevel readout signal/ A4280T Optical storage and retrieval A0250 Probability theory, stochastic processes, and statistics B4120 Optical storage and retrieval B6120B Codes B6140M Signal detection B0240Z Other topics in statistics
中文摘要	Multi-level optical recording using run-length-limited (RLL) modulation is a novel method to significantly increase the information recording density without changing optical or mechanical parameters. In this paper, the experimental results of four-level RLL modulation on read-only digital versatile discs (DVD-ROM) are introduced. A new DC-free 4-level RLL (2, 8) code with code rate of 8/10 (bits/symbol) is designed, and a partial response maximum-likelihood (PRML) detector is adopted to evaluate the detection performance of multi-level readout signals. By analyzing and comparing the simulation performances of different PRML schemes, we conclude that PR(1, 2, 2, 2, 1) target is preferred to be applied in four-level RLL modulation DVD channels.
会议录出版者	SPIE - The International Society for Optical Engineering ; USA
语种	英语 ; 英语
内容类型	会议论文
源URL	[http://hdl.handle.net/123456789/19434]
专题	清华大学
推荐引用方式 GB/T 7714	Hua Hu,Longfa Pan,Yi Ni. PRML detection of multi-level run-length limited DVD system[C]. 见:Proceedings of the SPIE - The International Society for Optical Engineering, Quantum Optics, Optical Data Storage, and Advanced Microlithography, Beijing, China, INSPEC.

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