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	Near-field intensity distribution from a bow-tie aperture VCSEL with its polarization state improved
	Hongfeng Gai ; Jia Wang ; Qian Tian ; Wei Xia ; Xiangang Xu
	2010-05-10 ; 2010-05-10
会议名称	Proceedings of the SPIE - The International Society for Optical Engineering ; Nanophotonics, Nanostructure, and Nanometrology II ; Beijing, China ; INSPEC
关键词	Experimental/ light polarisation near-field scanning optical microscopy surface emitting lasers/ micro-aperture vertical-cavity surface-emitting laser active nanophotonics devices confinement effect bow-tie aperture/ B4320J Semiconductor lasers
中文摘要	A micro-aperture vertical-cavity surface-emitting laser (VCSEL) is a kind of active nanophotonics devices. It can confine the optical near-field to a nanometric light spot of high intensity. The confinement effect is usually implemented by a round aperture. A bow-tie aperture can do it better if the incident light polarizes along the line between its ridges. However, a conventional VCSEL does not have a definite polarization state, so a bow-tie aperture VCSEL is very difficult to be implemented. In order to solver this problem, a rectangular aperture array is employed to improve the polarization state. Two bow-tie aperture VCSELs with and without their polarization state improved are fabricated. Their near-field intensity distribution is measured and compared. The measurement results demonstrate that the near-field intensity is enhanced dramatically when the polarization state is improved. So the confinement and enhancement effect of a bow-tie aperture can be obtained on the basis of a micro-aperture VCSEL.
会议录出版者	SPIE - The International Society for Optical Engineering ; USA
语种	英语 ; 英语
内容类型	会议论文
源URL	[http://hdl.handle.net/123456789/19336]
专题	清华大学
推荐引用方式 GB/T 7714	Hongfeng Gai,Jia Wang,Qian Tian,et al. Near-field intensity distribution from a bow-tie aperture VCSEL with its polarization state improved[C]. 见:Proceedings of the SPIE - The International Society for Optical Engineering, Nanophotonics, Nanostructure, and Nanometrology II, Beijing, China, INSPEC.

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