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Design and analysis of bow-tie aperture with strong near-field enhancement effect
Xu, JY ; Wang, J ; Tian, Q
2010-05-10 ; 2010-05-10
会议名称Nanophotonics, Nanostructure, and Nanometrology ; Conference on Nanophotonics, Nanostructure and Nanometrology ; Beijing, PEOPLES R CHINA ; Web of Science ; INSPEC
关键词near-field optics nano-aperture bow-tie aperture FDTD OPTICAL-DATA STORAGE SURFACE-EMITTING LASER SUBWAVELENGTH APERTURE LIGHT TRANSMISSION SIMULATION HOLES Instruments & Instrumentation Optics
中文摘要In this paper the near-field distributions of bow-tie apertures in visible range are characterized by the method of 3D finite-difference time-domain (FDTD). The numerical simulation results reveal theoretically the relation of field enhancement effect of bow-tie aperture and its several parameters including tip angle, aperture size and film thickness. For the bow-tie aperture with a certain tip angle, the metallic film's thickness can be firstly determined at its resonant peak, and then the aperture size can be determined at a tradeoff between the field enhancement and the field distribution. The calculation results of the transformed bow-tie apertures indicate that the transformation at tip angle will bring an obvious change to light field distribution. The bow-tie aperture can be directly used as an exit aperture of a very small aperture laser (VSAL) or as an unattached shield, to produce a sub-wavelength light source with high transmission. It is possible to be used in near field super-resolution imaging, high-density optical data storage, nano-photolithograhy and so on.
会议录出版者SPIE-INT SOC OPTICAL ENGINEERING ; BELLINGHAM ; 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA
语种英语 ; 英语
内容类型会议论文
源URL[http://hdl.handle.net/123456789/19238]  
专题清华大学
推荐引用方式
GB/T 7714
Xu, JY,Wang, J,Tian, Q. Design and analysis of bow-tie aperture with strong near-field enhancement effect[C]. 见:Nanophotonics, Nanostructure, and Nanometrology, Conference on Nanophotonics, Nanostructure and Nanometrology, Beijing, PEOPLES R CHINA, Web of Science, INSPEC.
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