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	Influence of residual thermal stresses and geometric parameters on stress and electric fields in multilayer ceramic capacitors under electric bias
	Wu-Gui Jiang ; Xi-Qiao Feng ; Ce-Wen Nan
	2010-05-07 ; 2010-05-07
关键词	Practical Theoretical or Mathematical/ ceramic capacitors dielectric thin films ferroelectric ceramics finite element analysis internal stresses sintering thermal stresses thermomechanical treatment/ residual thermal stresses geometric parameters stress fields electric fields multilayer ceramic capacitors 3D finite element model ferroelectric ceramics thermal-mechanical analysis sintering process electrical-mechanical analysis dielectric layers single layer thickness MLCC devices/ B2130 Capacitors
中文摘要	The stress and electric fields in multilayer ceramic capacitors (MLCCs) under an applied electric bias were investigated by using a three-dimensional finite element model of ferroelectric ceramics. A coupled thermal-mechanical analysis was first made to calculate the residual thermal stress induced by the sintering process, and then a coupled electrical-mechanical analysis was performed to predict the total stress distribution in the MLCCs under a representative applied electric bias. The effects of the number of dielectric layers, the single layer thickness as well as the residual thermal stresses on the total stresses were all examined. The numerical results show that the residual thermal stress induced by the sintering process has a significant influence on the contribution of the total stresses and, therefore, should be taken into account in the design and evaluation of MLCC devices.
语种	英语 ; 英语
出版者	IOP Publishing Ltd. ; UK
内容类型	期刊论文
源URL	[http://hdl.handle.net/123456789/16258]
专题	清华大学
推荐引用方式 GB/T 7714	Wu-Gui Jiang,Xi-Qiao Feng,Ce-Wen Nan. Influence of residual thermal stresses and geometric parameters on stress and electric fields in multilayer ceramic capacitors under electric bias[J],2010, 2010.
APA	Wu-Gui Jiang,Xi-Qiao Feng,&Ce-Wen Nan.(2010).Influence of residual thermal stresses and geometric parameters on stress and electric fields in multilayer ceramic capacitors under electric bias..
MLA	Wu-Gui Jiang,et al."Influence of residual thermal stresses and geometric parameters on stress and electric fields in multilayer ceramic capacitors under electric bias".(2010).

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