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	Large-deformation analysis in microscopic area using micro-moire methods with a focused ion beam milling grating
	Du, Hua ; Xie, Huimin ; Guo, Zhiqlang ; Pan, Bing ; Luo, Qiang ; Gu, Changzhi ; Jiang, Haichang ; Rong, Lijian
	2010-05-07 ; 2010-05-07
关键词	SEM moire digital moire FIB milling grating large-deformation measurement shear band SHAPE-MEMORY ALLOY AUTOMATIC FRINGE ANALYSIS STRESS-STRAIN BEHAVIOR TINI INTERFEROMETRY FABRICATION ALGORITHM POWDERS Optics
中文摘要	In this study, the focused ion beam (FIB) milling method is applied to fabricate sub-micron grating on TiNi shape memory alloy materials. With self-made FIB milling gratings, scanning electron microscope (SEM) micro-moire and digital moire methods are successfully used to measure large deformation of porous TiNi shape memory alloys (SMA) in uni-axial compressive tests. The principles of the SEM micro-moire method and digital moire method are introduced, and applied to calculate large strain. The full field deformation around shear bands can be measured precisely. During the investigation, the phenomenon of furcated moire fringes was found, and a corresponding explanation is given in this paper. The furcated fringes are generated in the locations of combined shear bands where sudden changes of strain occur. Successful results also verify that the FIB milling gratings are suitable for micro-moire measurement and can generate high quality moire fringes. (C) 2007 Elsevier Ltd. All rights reserved.
语种	英语 ; 英语
出版者	ELSEVIER SCI LTD ; OXFORD ; THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, OXON, ENGLAND
内容类型	期刊论文
源URL	[http://hdl.handle.net/123456789/15801]
专题	清华大学
推荐引用方式 GB/T 7714	Du, Hua,Xie, Huimin,Guo, Zhiqlang,et al. Large-deformation analysis in microscopic area using micro-moire methods with a focused ion beam milling grating[J],2010, 2010.
APA	Du, Hua.,Xie, Huimin.,Guo, Zhiqlang.,Pan, Bing.,Luo, Qiang.,...&Rong, Lijian.(2010).Large-deformation analysis in microscopic area using micro-moire methods with a focused ion beam milling grating..
MLA	Du, Hua,et al."Large-deformation analysis in microscopic area using micro-moire methods with a focused ion beam milling grating".(2010).

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