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Self-localization of holes in a lightly doped Mott insulator
Kou, SP ; Weng, ZY
2010-05-06 ; 2010-05-06
关键词T-J MODEL THERMOELECTRIC-POWER DIELECTRIC-CONSTANT METAL TRANSITION GAUGE FIELD CONDUCTIVITY ANTIFERROMAGNET DEPENDENCE LA2CUO4+Y TRANSPORT Physics, Condensed Matter
中文摘要We show that lightly doped holes will be self-trapped in an antiferromagnetic spin background at low-temperature, resulting in spontaneous translational symmetry breaking. The underlying Mott physics is responsible for such novel self-localization of charge carriers. Interesting transport and dielectric properties are found as the consequences, including large doping-dependent thermopower and dielectric constant, low-temperature variable-range-hopping resistivity, as well as high-temperature strange-metal-like resistivity, which are consistent with experimental measurements in the high-T-c cuprates. Disorder and impurities only play a minor and assistant role here.
语种英语 ; 英语
出版者SPRINGER ; NEW YORK ; 233 SPRING STREET, NEW YORK, NY 10013 USA
内容类型期刊论文
源URL[http://hdl.handle.net/123456789/14576]  
专题清华大学
推荐引用方式
GB/T 7714
Kou, SP,Weng, ZY. Self-localization of holes in a lightly doped Mott insulator[J],2010, 2010.
APA Kou, SP,&Weng, ZY.(2010).Self-localization of holes in a lightly doped Mott insulator..
MLA Kou, SP,et al."Self-localization of holes in a lightly doped Mott insulator".(2010).
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