Hysteresis effect in adhesive elastic contact

CORC > 力学研究所 > 中国科学院力学研究所 > 力学所知识产出(1956-2008)

	Hysteresis effect in adhesive elastic contact
	Wei Z(魏征); Zhao YP(赵亚溥)
	2003
会议名称	2003 ASME Design Engineering Technical Conferences and Computers and Information in Engineering Conference
会议日期	September 2, 2003 - September 6, 2003
会议地点	Chicago, IL, United states
关键词	Scanning probe microscope (SPM) Transition parameter
中文摘要	Adhesive forces in microscale or nanoscale contact play a significant role in microelectromechanical systems (MEMS); scanning probe microscope (SPM) and some other related fields. In this paper, the relationship between the pull-off force and the transition parameter as well as the variation of the pull-off radius with the transition parameter is given. When hysteresis effect is considered, hysteresis models are presented to describe the contact radius as a function of external load in loading and unloading processes. Among these models, we verified the hysteresis model from JKR, which is in a good agreement with experiment. The parameter α of dissipated elastic energy can be measured through experiment.
收录类别	EI
会议录	Proceedings of the ASME Design Engineering Technical Conference
语种	英语
内容类型	会议论文
源URL	[http://dspace.imech.ac.cn/handle/311007/60268]
专题	力学研究所_力学所知识产出(1956-2008)
推荐引用方式 GB/T 7714	Wei Z,Zhao YP. Hysteresis effect in adhesive elastic contact[C]. 见:2003 ASME Design Engineering Technical Conferences and Computers and Information in Engineering Conference. Chicago, IL, United states. September 2, 2003 - September 6, 2003.