Evolution of structural distortion in BiFeO3 thin films probed by second-harmonic generation

CORC > 上海应用物理研究所 > 中国科学院上海应用物理研究所 > 中科院上海应用物理研究所2011-2017年

	Evolution of structural distortion in BiFeO3 thin films probed by second-harmonic generation
	Wang, JS; Jin, KJ; Guo, HZ; Gu, JX; Wan, Q; He, X; Li, XL; Xu, XL; Yang, GZ
刊名	SCIENTIFIC REPORTS
	2016
卷号	6 页码:-
ISSN号	2045-2322
通讯作者	Jin, KJ (reprint author), Chinese Acad Sci, Inst Phys, Beijing Natl Lab Condensed Matter Phys, Beijing 100190, Peoples R China. ; Jin, KJ (reprint author), Univ Chinese Acad Sci, Beijing 100049, Peoples R China. ; Jin, KJ (reprint author), Collaborat Innovat Ctr Quantum Matter, Beijing 100190, Peoples R China.
英文摘要	BiFeO3 thin films have drawn much attention due to its potential applications for novel magnetoelectric devices and fundamental physics in magnetoelectric coupling. However, the structural evolution of BiFeO3 films with thickness remains controversial. Here we use an optical second-harmonic generation technique to explore the phase-related symmetry evolution of BiFeO3 thin films with the variation of thickness. The crystalline structures for 60 and 180-nm-thick BiFeO3 thin films were characterized by high-resolution X-ray diffractometry reciprocal space mapping and the local piezoelectric response for 60-nm-thick BiFeO3 thin films was characterized by piezoresponse force microscopy. The present results show that the symmetry of BiFeO3 thin films with a thickness below 60 nm belongs to the point group 4 mm. We conclude that the disappearance of fourfold rotational symmetry in SHG s-out pattern implies for the appearance of R-phase. The fact that the thinner the film is, the closer to 1 the tensor element ratio chi(31)/chi(15) tends, indicates an increase of symmetry with the decrease of thickness for BiFeO3 thin films.
收录类别	SCI
语种	英语
WOS记录号	WOS:000388985800001
内容类型	期刊论文
源URL	[http://ir.sinap.ac.cn/handle/331007/26502]
专题	上海应用物理研究所_中科院上海应用物理研究所2011-2017年
推荐引用方式 GB/T 7714	Wang, JS,Jin, KJ,Guo, HZ,et al. Evolution of structural distortion in BiFeO3 thin films probed by second-harmonic generation[J]. SCIENTIFIC REPORTS,2016,6:-.
APA	Wang, JS.,Jin, KJ.,Guo, HZ.,Gu, JX.,Wan, Q.,...&Yang, GZ.(2016).Evolution of structural distortion in BiFeO3 thin films probed by second-harmonic generation.SCIENTIFIC REPORTS,6,-.
MLA	Wang, JS,et al."Evolution of structural distortion in BiFeO3 thin films probed by second-harmonic generation".SCIENTIFIC REPORTS 6(2016):-.