Analysis and reduction of phase errors caused by nonuniform surface reflectivity in a phase-shifting measurement system

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	Analysis and reduction of phase errors caused by nonuniform surface reflectivity in a phase-shifting measurement system
	Chen SL(陈松林); Xia RB(夏仁波); Zhao JB(赵吉宾); Zhang HY(张洪瑶); Hu MB(胡茂邦)
刊名	Optical Engineering
	2017
卷号	56 期号:3 页码:1-9
关键词	three-dimensional measurement structured light phase shifting phase error analysis phase error reduction
ISSN号	0091-3286
通讯作者	夏仁波
产权排序	1
中文摘要	The measurement accuracy of a phase-shifting measurement system is adversely affected by phase errors. This paper presents a theoretical analysis of phase errors caused by nonuniform surface reflectivity, such as varying reflectivity and a sharp change in reflectivity. Based on the analysis, a method to adaptively adjust the maximum input gray level of each pixel in projected fringe patterns to the local reflectivity was proposed to reduce phase errors. Experimental results for a planar checkerboard show that the measurement error can be reduced by 56.6% by using the proposed method.
WOS标题词	Science & Technology ; Physical Sciences
类目[WOS]	Optics
研究领域[WOS]	Optics
关键词[WOS]	HIGH DYNAMIC-RANGE ; 3-DIMENSIONAL SHAPE MEASUREMENT ; DIGITAL FRINGE PROJECTION ; SATURATION AVOIDANCE ; PROFILOMETRY ; POLARIZATION ; OBJECTS
收录类别	SCI ; EI
语种	英语
WOS记录号	WOS:000397207200026
内容类型	期刊论文
源URL	[http://ir.sia.cn/handle/173321/20209]
专题	沈阳自动化研究所_装备制造技术研究室
推荐引用方式 GB/T 7714	Chen SL,Xia RB,Zhao JB,et al. Analysis and reduction of phase errors caused by nonuniform surface reflectivity in a phase-shifting measurement system[J]. Optical Engineering,2017,56(3):1-9.
APA	Chen SL,Xia RB,Zhao JB,Zhang HY,&Hu MB.(2017).Analysis and reduction of phase errors caused by nonuniform surface reflectivity in a phase-shifting measurement system.Optical Engineering,56(3),1-9.
MLA	Chen SL,et al."Analysis and reduction of phase errors caused by nonuniform surface reflectivity in a phase-shifting measurement system".Optical Engineering 56.3(2017):1-9.