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	Test pattern selection for potentially harmful open defects in power distribution networks
	Yubin Zhang; Lin Huang; Feng Yuan; Qiang Xu
	2009
会议名称	18th Asian Test Symposium, ATS 2009
英文摘要	Power distribution network (PDN) designs for today's high performance integrated circuits (ICs) typically occupy a significant share of metal resources in the circuit, and hence defects may be introduced on PDNs during the manufacturing process. Since we cannot afford to over-design the PDNs to tolerate all possible defects, it is necessary to conduct manufacturing test for them. In this paper, we propose novel methodologies to identify those potentially harmful open defects in PDNs and we show how to select a set of patterns that initially target transition faults to achieve high fault coverage for the PDN defects. Experimental results on benchmark circuits demonstrate the effectiveness of the proposed technique.
收录类别	EI
语种	英语
内容类型	会议论文
源URL	[http://ir.siat.ac.cn:8080/handle/172644/2507]
专题	深圳先进技术研究院_集成所
作者单位	2009
推荐引用方式 GB/T 7714	Yubin Zhang,Lin Huang,Feng Yuan,et al. Test pattern selection for potentially harmful open defects in power distribution networks[C]. 见:18th Asian Test Symposium, ATS 2009.

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