On Multiplexed Signal Tracing for Post-Silicon Validation
Liu Xiao; Xu Qiang
刊名IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
2013
英文摘要Trace-based debug techniques have widely been utilized in the industry to eliminate design errors escaped from pre-silicon verification. Existing solutions typically trace the same set of signals throughout each debug run, which is not quite effective for catching design errors. In this paper, we propose a multiplexed signal tracing strategy that is able to significantly increase debuggability of the circuit. That is, we divide the tracing procedure in each debug run into a few periods and trace different sets of signals in each period. We present a trace signal grouping algorithm to maximize the probability of catching the propagated evidences from design errors, considering the trace interconnection fabric design constraints. Moreover, we propose a trace signal selection solution to enhance the error detection capability. Experimental results on benchmark circuits demonstrate the effectiveness of the proposed solution.
收录类别SCI
原文出处http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6504557&contentType=Journals+%26+Magazines&sortType%3Dasc_p_Sequence%26filter%3DAND(p_IS_Number%3A6504524)
语种英语
内容类型期刊论文
源URL[http://ir.siat.ac.cn:8080/handle/172644/4461]  
专题深圳先进技术研究院_集成所
作者单位IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
推荐引用方式
GB/T 7714
Liu Xiao,Xu Qiang. On Multiplexed Signal Tracing for Post-Silicon Validation[J]. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS,2013.
APA Liu Xiao,&Xu Qiang.(2013).On Multiplexed Signal Tracing for Post-Silicon Validation.IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS.
MLA Liu Xiao,et al."On Multiplexed Signal Tracing for Post-Silicon Validation".IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS (2013).
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