In situ AFM Investigation of Interfacial Morphology of Single Crystal Silicon Wafer Anode

CORC > 化学研究所 > 中国科学院化学研究所 > 分子纳米结构与纳米技术实验室

	In situ AFM Investigation of Interfacial Morphology of Single Crystal Silicon Wafer Anode
	Liu Xing-Rui; Yan Hui-Juan; Wang Dong; Wan Li-Jun
刊名	ACTA PHYSICO-CHIMICA SINICA
	2016-01-15
卷号	32 期号:1 页码:283-289
关键词	Si anode Solid electrolyte interphase In situ atomic force microscopy
英文摘要	The interfacial morphology of a single crystal Si wafer anode during the first dischargingcharging cycle was investigated using in situ atomic force microscopy (AFM). The solidelectrolyte interphase (SEI) began to grow from 1.5 V, developing rapidly between 1.25 and 1.0 V, and slowed down after 0.6 V. The morphology suggested that the SEI had a layered structure. The outer layer of SEI was soft and easy to be scraped off during the AFM tip scanning. The underlayer of SEI had granular features. During the lithiation process, the Si surface became grainy because of the insertion of Li ions. After the first cycle, the Si surface was completely covered by inhomogeneous SEI. The thickness of the SEI was approximately 10-40 nm.
收录类别	SCI
语种	英语
内容类型	期刊论文
源URL	[http://ir.iccas.ac.cn/handle/121111/35864]
专题	化学研究所_分子纳米结构与纳米技术实验室
作者单位	Chinese Acad Sci, Inst Chem, Beijing Natl Lab Mol Sci, CAS Key Lab Mol Nanostruct & Nanotechnol, Beijing 100190, Peoples R China
推荐引用方式 GB/T 7714	Liu Xing-Rui,Yan Hui-Juan,Wang Dong,et al. In situ AFM Investigation of Interfacial Morphology of Single Crystal Silicon Wafer Anode[J]. ACTA PHYSICO-CHIMICA SINICA,2016,32(1):283-289.
APA	Liu Xing-Rui,Yan Hui-Juan,Wang Dong,&Wan Li-Jun.(2016).In situ AFM Investigation of Interfacial Morphology of Single Crystal Silicon Wafer Anode.ACTA PHYSICO-CHIMICA SINICA,32(1),283-289.
MLA	Liu Xing-Rui,et al."In situ AFM Investigation of Interfacial Morphology of Single Crystal Silicon Wafer Anode".ACTA PHYSICO-CHIMICA SINICA 32.1(2016):283-289.