A rapid and automated relocation method of an AFM probe for high-resolution imaging

CORC > 沈阳自动化研究所 > 中国科学院沈阳自动化研究所 > 机器人学研究室

	A rapid and automated relocation method of an AFM probe for high-resolution imaging
	Zhou PL(周培林); Yu HB(于海波); Shi JL(施佳林); Jiao ND(焦念东); Wang ZD(王志东); Wang YC(王越超); Liu LQ(刘连庆)
刊名	Nanotechnology
	2016
卷号	27 期号:39 页码:1-10
关键词	AFM relocation automated label-free nano targets
ISSN号	0957-4484
通讯作者	于海波 ; 刘连庆
产权排序	1
中文摘要	The atomic force microscope (AFM) is one of the most powerful tools for high-resolution imaging and high-precision positioning for nanomanipulation. The selection of the scanning area of the AFM depends on the use of the optical microscope. However, the resolution of an optical microscope is generally no larger than 200 nm owing to wavelength limitations of visible light. Taking into consideration the two determinants of relocation-relative angular rotation and positional offset between the AFM probe and nano target-it is therefore extremely challenging to precisely relocate the AFM probe to the initial scan/manipulation area for the same nano target after the AFM probe has been replaced, or after the sample has been moved. In this paper, we investigate a rapid automated relocation method for the nano target of an AFM using a coordinate transformation. The relocation process is both simple and rapid; moreover, multiple nano targets can be relocated by only identifying a pair of reference points. It possesses a centimeter-scale location range and nano-scale precision. The main advantages of this method are that it overcomes the limitations associated with the resolution of optical microscopes, and that it is label-free on the target areas, which means that it does not require the use of special artificial markers on the target sample areas. Relocation experiments using nanospheres, DNA, SWCNTs, and nano patterns amply demonstrate the practicality and efficiency of the proposed method, which provides technical support for mass nanomanipulation and detection based on AFM for multiple nano targets that are widely distributed in a large area.
WOS标题词	Science & Technology ; Technology ; Physical Sciences
类目[WOS]	Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Physics, Applied
研究领域[WOS]	Science & Technology - Other Topics ; Materials Science ; Physics
关键词[WOS]	ATOMIC-FORCE MICROSCOPY ; CARBON NANOTUBES ; ULTRATHIN FILMS ; SCANNING-PROBE ; TIP ; DNA ; SAMPLES ; MICA ; SUBSTRATE ; EVOLUTION
收录类别	SCI ; EI
语种	英语
WOS记录号	WOS:000383998300005
内容类型	期刊论文
源URL	[http://ir.sia.cn/handle/173321/19232]
专题	沈阳自动化研究所_机器人学研究室
推荐引用方式 GB/T 7714	Zhou PL,Yu HB,Shi JL,et al. A rapid and automated relocation method of an AFM probe for high-resolution imaging[J]. Nanotechnology,2016,27(39):1-10.
APA	Zhou PL.,Yu HB.,Shi JL.,Jiao ND.,Wang ZD.,...&Liu LQ.(2016).A rapid and automated relocation method of an AFM probe for high-resolution imaging.Nanotechnology,27(39),1-10.
MLA	Zhou PL,et al."A rapid and automated relocation method of an AFM probe for high-resolution imaging".Nanotechnology 27.39(2016):1-10.