Temperature Dependence of the AlN E1(To) Phonon Decay, Thermal Expansion and Strain Effect in AlN/Sapphire by Infrared Reflection
GUOJian-Hua QIUFeng ZHANGYun DENGHui-Yong HUGu-Jin LIXiao-Nan YUGuo-Lin DAINing
刊名CHIN.PHYS.LETT.
2013
卷号30期号:9
学科主题红外基础研究
公开日期2014-11-10
内容类型期刊论文
源URL[http://202.127.1.142/handle/181331/7766]  
专题上海技术物理研究所_上海技物所
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GUOJian-Hua QIUFeng ZHANGYun DENGHui-Yong HUGu-Jin LIXiao-Nan YUGuo-Lin DAINing. Temperature Dependence of the AlN E1(To) Phonon Decay, Thermal Expansion and Strain Effect in AlN/Sapphire by Infrared Reflection[J]. CHIN.PHYS.LETT.,2013,30(9).
APA GUOJian-Hua QIUFeng ZHANGYun DENGHui-Yong HUGu-Jin LIXiao-Nan YUGuo-Lin DAINing.(2013).Temperature Dependence of the AlN E1(To) Phonon Decay, Thermal Expansion and Strain Effect in AlN/Sapphire by Infrared Reflection.CHIN.PHYS.LETT.,30(9).
MLA GUOJian-Hua QIUFeng ZHANGYun DENGHui-Yong HUGu-Jin LIXiao-Nan YUGuo-Lin DAINing."Temperature Dependence of the AlN E1(To) Phonon Decay, Thermal Expansion and Strain Effect in AlN/Sapphire by Infrared Reflection".CHIN.PHYS.LETT. 30.9(2013).
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