Characterization of Te-antisite-related defects in HgCdTe

	Characterization of Te-antisite-related defects in HgCdTe
	ZiyanWang YanHuang XiaoshuangChen XiaohaoZhou HuxianZhao WeiLu
刊名	Physics Letters A
	2013
卷号	377 期号:38
关键词	Te-antisitedefect HgCdTe Electronicstructure First-principlescalculation
学科主题	红外基础研究
公开日期	2014-11-10
内容类型	期刊论文
源URL	[http://202.127.1.142/handle/181331/7740]
专题	上海技术物理研究所_上海技物所
推荐引用方式 GB/T 7714	ZiyanWang YanHuang XiaoshuangChen XiaohaoZhou HuxianZhao WeiLu. Characterization of Te-antisite-related defects in HgCdTe[J]. Physics Letters A,2013,377(38).
APA	ZiyanWang YanHuang XiaoshuangChen XiaohaoZhou HuxianZhao WeiLu.(2013).Characterization of Te-antisite-related defects in HgCdTe.Physics Letters A,377(38).
MLA	ZiyanWang YanHuang XiaoshuangChen XiaohaoZhou HuxianZhao WeiLu."Characterization of Te-antisite-related defects in HgCdTe".Physics Letters A 377.38(2013).