Structure-change-dependent transmittance of PtOx thin film in super-resolution near-field structure: Diffraction effect analysis

CORC > 上海光学精密机械研究所 > 中国科学院上海光学精密机械研究所 > 高密度光存储技术实验室

	Structure-change-dependent transmittance of PtOx thin film in super-resolution near-field structure: Diffraction effect analysis
	Qu Qingling ; Wang Yang ; Gan FX(干福熹)
刊名	phys. lett. a
	2007
卷号	368 页码:271
关键词	Gaussian diffraction model far-field Super-RENS micro-structural deformation
ISSN号	0375-9601
中文摘要	to study working mechanism of super-resolution near-field structure (super-rens) optical disk from a far-field optics view is very necessary because of the actual far-field writing/readout process in the optical disk system. a gaussian diffraction model based on fresnel-kirchhoff diffraction theory of ptox-type super-rens has been set up in this letter. the relationship between micro-structural deformation (change of bubble structure and refractive index profile) with far-field optical response of ptox thin film has been studied with it in detail. the simulation results are in good agreement with the experimental results reported in literatures with a designed configuration. these results may provide more quantitative information for better understanding of the working mechanism of metal-oxide-type super-rens. (c) 2007 elsevier b.v. all rights reserved.
学科主题	光存储
收录类别	0
语种	英语
WOS记录号	WOS:000249332500017
公开日期	2009-09-22
内容类型	期刊论文
源URL	[http://ir.siom.ac.cn/handle/181231/3977]
专题	上海光学精密机械研究所_高密度光存储技术实验室
推荐引用方式 GB/T 7714	Qu Qingling,Wang Yang,Gan FX. Structure-change-dependent transmittance of PtOx thin film in super-resolution near-field structure: Diffraction effect analysis[J]. phys. lett. a,2007,368:271, 275.
APA	Qu Qingling,Wang Yang,&干福熹.(2007).Structure-change-dependent transmittance of PtOx thin film in super-resolution near-field structure: Diffraction effect analysis.phys. lett. a,368,271.
MLA	Qu Qingling,et al."Structure-change-dependent transmittance of PtOx thin film in super-resolution near-field structure: Diffraction effect analysis".phys. lett. a 368(2007):271.