| 题名 | 双折射元器件的相位延迟量测量方法研究 |
| 作者 | 刘龙海 |
| 学位类别 | 硕士 |
| 答辩日期 | 2013 |
| 授予单位 | 中国科学院上海光学精密机械研究所 |
| 导师 | 曾爱军 |
| 关键词 | 偏振 双折射 相位延迟量 波片 相位调制器 |
| 其他题名 | Study of measurement of retardation of birefringent components |
| 中文摘要 | 双折射元器件在偏振光技术中被广泛使用，其相位延迟量影响了偏振光学系统的性能。随着偏振光技术的快速发展，偏振光系统对双折射元器件的相位延迟量有很高的要求，在使用前和使用中，双折射元器件的相位延迟量需要被精密测量。本文围绕对双折射元器件的相位延迟量测量方法进行研究。测量精度高速度快，结构简单紧凑，操作方便，可测量大口径双折射元器件的相位延迟量分布。本论文的主要研究工作包括： 1. 概述了双折射效应的概念并介绍了相关的元器件，分析了现有的双折射元器件的相位延迟量测量方法。详细介绍了偏振光的描述方法，介绍了偏振移相技术和偏振相位调制技术。 2. 提出了四分之一波片、八分之一波长和可调波片的相位延迟量测量方法。提出了一种四分之一波片的相位延迟量测量方法，测量结果与测量光源的初始光强波动和待测波片的快轴方位角无关。实验中一个四分之一波长附近的楔形波片被测量，测量的相位延迟量分布的标准差是0.4°。提出了八分之一波片的相位延迟量和快轴方位角的测量方法。对测量光源光强正弦调制，通过将待测波片旋转45º前后采集四个信号进行处理，可高精度测量其相位延迟量和快轴方位角。实验中八分之一波长附近的楔形波片在不同位置被测量，相位延迟量和快轴方位角的最大标准差分别是0.06º和0.05º。提出了可调波片的相位延迟量和快轴方位角的测量，测量结果不受光源初始光强波动的影响。通过分光的方法可以高速实时测量一个相位延迟量正弦调制的可看成可调波片的光弹调制器的相位延迟量和快轴方位角。相位延迟量的最大偏差是1.68nm，快轴方位角的最大标准差为0.47°。实验结果验证了波片的相位延迟量测量方法的有效性。 3. 提出了正弦相位调制器的峰值相位延迟量测量方法。该方法通过反射光路使测量光束两次通过正弦相位调制器，可测量正弦相位调制器的低于半个波长的峰值相位延迟量。光路紧凑，结构简单，测量精度高。实验中，一个光弹调制器的峰值相位延迟量被测量，测量偏差为0.06nm。实验结果验证了该测量方法的可行性以及光弹调制器的可用性。 4. 研究了成像式和扫描式玻璃平板的相位延迟量分布测量方案。通过光栅分束和检偏器阵列引入移相，通过采集并处理移相图像可测量玻璃平板的位延迟量分布。成像法测量速度快，可动态实时测量玻璃平板的相位延迟量分布。使用光弹调制器引入周期性的相位调制，锁相测量信号的基频分量可测量其相位延迟量。此方法测量光束两次通过待测玻璃平板，相位延迟量测量精度提高一倍。通过单端扫描即可测量玻璃平板的相位延迟量分布，具有很好的可行性。 |
| 英文摘要 | The birefringent components are widely used in polarization optics technology and the retardation affects the performance of polarization optics system. Before and during their usage, the retardation of birefringent components needs be precisely measured. Based on the polarization phase shifting technology and the polarization phase modulation technique, methods to measure the retardation of birefringent components are investigated in this paper. The measurement is of high accuracy and high speed. It is of simple and compact structure and is easy to operate. These methods can measure the full field retardation of the large aperture birefringent components. In this paper, the main research work is focused on the following issues. 1. The concept of birefringence and corresponding birefringent components are introduced. The available methods to measure the retardation of birefringent components are investigated. The basic principles of polarization optics, phase shifting technology and phase modulation technique are described. 2. Methods to measure the retardation of the quarter waveplate, eighth waveplate and tunable waveplate are proposed. Firstly one method to measure the retardation of the quarter waveplate is proposed. The measured result is immune to the fast axis angle of the waveplate and the fluctuation of the initial light intensity. A wedge waveplate with the retardation near quarter wavelength was measured in experiment. The standard deviation of the measured result is 0.4°. Then one method to measure the retardation of the eighth waveplate is proposed. Through intensity modulation of the light source and rotation of the eighth waveplate to be measured, retardation and fast axis angle of the eighth waveplate is measured simultaneously. A wedge waveplate with the retardation near eighth wavelength was measured in different position, the maximum standard deviation of the retardation and the fast axis angle is respectively 0.06º and 0.05º. Finally, method to measure the retardation and fast axis angle of a tunable waveplate is proposed. The measured result is independent of the fluctuation of the initial intensity of light source. A photoelastic modulator was measured, which could be seen as tunable waveplate. The maximum deviation of the retardation is 1.68 nm. The standard deviation of the fast axis angle is 0.47°. The measured results verify the validity of these methods. 3. Method to measure the peak retardation of the sinusoidal phase modulator is proposed. The measurement beam passes through the sinusoidal phase modulator twice, this method can measure the peak retardation of less than half wavelength. This method is of simple and compact structure, easy to operate and is of high measurement accuracy. A photoelastic modulator was measured in experiment and the deviation of the peak retardation is 0.06nm. The measured peak retardation verifies the validity of this method and the usability of the photoelastic modulator. 4. Two methods of measuring full field retardation of glass plate are studied. Grating and analyzer array is used to introduce phase shift. By capturing and processing phase shift images, full field retardation of glass plate can be measured. This method is of high speed and can dynamically measure the full field retardation. Then a photoelastic modulator is used to create the periodic phase modulation, the retardation of the glass plate can be obtained through processing the 1F signals. The measuring beam passes through the glass plate twice, thus the measurement accuracy doubles the conventional method. The full field retardation of the glass plate can be measured through single side scanning. These methods are of good feasibility. |
| 语种 | 中文 |
| 内容类型 | 学位论文 |
| 源URL | [http://ir.siom.ac.cn/handle/181231/16783]  |
| 专题 | 上海光学精密机械研究所_学位论文 |
| 推荐引用方式 GB/T 7714 | 刘龙海. 双折射元器件的相位延迟量测量方法研究[D]. 中国科学院上海光学精密机械研究所. 2013. |
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