Measurement of random surface parameters of weak scatterers using the speckle contrast method | |
Cheng CF(程传福); Liu CX(刘春香); Teng SY(滕树云); Zhang NY(张宁玉); Li RX(李儒新); Xu ZZ(徐至展) | |
刊名 | chin. phys. lett.
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2002 | |
卷号 | 19期号:9页码:1283 |
通讯作者 | cheng, cf (reprint author), chinese acad sci, shanghai inst opt & fine mech, pob 800-211, shanghai 201800, peoples r china. |
英文摘要 | theoretical analysis shows that the deviation roughness w and the lateral correlation length xi of a weak scattering object determine the different properties of the contrast of the speckles in the image plane of a 4f system. experimentally, we have measured the data of the speckle contrast versus the radius r of the variable filtering aperture. by fitting the theoretical results to these data, we extract the parameters w and xi of the random surfaces with gaussian correlation. this method can determine the two parameters simultaneously and independently, and pre-calibrations are not needed. |
收录类别 | SCI |
语种 | 英语 |
WOS记录号 | WOS:000178088500020 |
内容类型 | 期刊论文 |
版本 | 出版稿 |
源URL | [http://ir.siom.ac.cn/handle/181231/17743] ![]() |
专题 | 上海光学精密机械研究所_强场激光物理国家重点实验室 |
作者单位 | 1.Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Shanghai 201800, Peoples R China 2.Shandong Normal Univ, Dept Phys, Jinan 250014, Peoples R China 3.Shandong Inst Architecture, Jinan 250014, Peoples R China |
推荐引用方式 GB/T 7714 | Cheng CF,Liu CX,Teng SY,et al. Measurement of random surface parameters of weak scatterers using the speckle contrast method[J]. chin. phys. lett.,2002,19(9):1283. |
APA | 程传福,刘春香,滕树云,张宁玉,李儒新,&徐至展.(2002).Measurement of random surface parameters of weak scatterers using the speckle contrast method.chin. phys. lett.,19(9),1283. |
MLA | 程传福,et al."Measurement of random surface parameters of weak scatterers using the speckle contrast method".chin. phys. lett. 19.9(2002):1283. |
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