Measurement of random surface parameters of weak scatterers using the speckle contrast method

CORC > 上海光学精密机械研究所 > 中国科学院上海光学精密机械研究所 > 强场激光物理国家重点实验室

	Measurement of random surface parameters of weak scatterers using the speckle contrast method
	Cheng CF(程传福); Liu CX(刘春香); Teng SY(滕树云); Zhang NY(张宁玉); Li RX(李儒新); Xu ZZ(徐至展)
刊名	chin. phys. lett.
	2002
卷号	19 期号:9 页码:1283
通讯作者	cheng, cf (reprint author), chinese acad sci, shanghai inst opt & fine mech, pob 800-211, shanghai 201800, peoples r china.
英文摘要	theoretical analysis shows that the deviation roughness w and the lateral correlation length xi of a weak scattering object determine the different properties of the contrast of the speckles in the image plane of a 4f system. experimentally, we have measured the data of the speckle contrast versus the radius r of the variable filtering aperture. by fitting the theoretical results to these data, we extract the parameters w and xi of the random surfaces with gaussian correlation. this method can determine the two parameters simultaneously and independently, and pre-calibrations are not needed.
收录类别	SCI
语种	英语
WOS记录号	WOS:000178088500020
内容类型	期刊论文
版本	出版稿
源URL	[http://ir.siom.ac.cn/handle/181231/17743]
专题	上海光学精密机械研究所_强场激光物理国家重点实验室
作者单位	1.Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Shanghai 201800, Peoples R China 2.Shandong Normal Univ, Dept Phys, Jinan 250014, Peoples R China 3.Shandong Inst Architecture, Jinan 250014, Peoples R China
推荐引用方式 GB/T 7714	Cheng CF,Liu CX,Teng SY,et al. Measurement of random surface parameters of weak scatterers using the speckle contrast method[J]. chin. phys. lett.,2002,19(9):1283.
APA	程传福,刘春香,滕树云,张宁玉,李儒新,&徐至展.(2002).Measurement of random surface parameters of weak scatterers using the speckle contrast method.chin. phys. lett.,19(9),1283.
MLA	程传福,et al."Measurement of random surface parameters of weak scatterers using the speckle contrast method".chin. phys. lett. 19.9(2002):1283.