Ray-tracing method to analyze and quantify the light enhancement around subsurface defects in transparent materials

CORC > 上海光学精密机械研究所 > 中国科学院上海光学精密机械研究所 > 高功率激光物理国家实验室

	Ray-tracing method to analyze and quantify the light enhancement around subsurface defects in transparent materials
	Wu, Rong ; Zhao, Dongfeng ; Zhang, Lei ; Shao, Ping ; Hua, Neng ; Lin, Zunqi
	2014
会议名称	conference on high-power lasers and applications vii
通讯作者	wu, r (reprint author), chinese acad sci, shanghai inst opt & fine mech, shanghai 201800, peoples r china.
英文摘要	laser-induced damage (lid) to optical glass has become a growing problem in high-power laser systems. it is well known that the main reason of glass being damaged is due to defects and impurities in the material. damage caused by subsurface defects (ssds) is especially common in actual system running. accordingly, in the presence of ssds, a simple and alternative calculation method is developed to evaluate the enhancement of light field around the incident and exit surface. this ray tracing approach, based on the classical optics theory, is very direct and clear to show the optical phenomena of light intensity enhancement. some basic ssd shapes have been studied and investigated here, which reveals the importance and boundary condition of controlling the size and density of ssds in grinding and polishing process. finally, to achieve optimal breadth depth ratio, the least etching amounts by hydrofluoric (hf) acid is investigated. the theoretical analysis and simulation results provide an appropriate range of removal amounts, which is very important in the hf etching process.
收录类别	CPCI
会议录	high-power lasers and applications vii
会议录出版者	spie-int soc optical engineering
语种	英语
内容类型	会议论文
源URL	[http://ir.siom.ac.cn/handle/181231/17176]
专题	上海光学精密机械研究所_高功率激光物理国家实验室
作者单位	1.[Wu, Rong 2.Zhao, Dongfeng 3.Zhang, Lei 4.Shao, Ping 5.Hua, Neng 6.Lin, Zunqi] Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Shanghai 201800, Peoples R China
推荐引用方式 GB/T 7714	Wu, Rong,Zhao, Dongfeng,Zhang, Lei,et al. Ray-tracing method to analyze and quantify the light enhancement around subsurface defects in transparent materials[C]. 见:conference on high-power lasers and applications vii.