Evaluation Damage Threshold of Optical Thin-Film Using an Amplified Spontaneous Emission Source

CORC > 上海光学精密机械研究所 > 中国科学院上海光学精密机械研究所 > 高功率激光物理国家实验室

	Evaluation Damage Threshold of Optical Thin-Film Using an Amplified Spontaneous Emission Source
	Zhou, Qiong ; Sun, Mingying ; Zhang, Zhixiang ; Yao, Yudong ; Peng, Yujie ; Liu, Dean ; Zhu, Jianqiang
	2014
会议名称	spie laser damage - 46th annual symposium on optical materials for high power lasers
通讯作者	zhu, jq (reprint author), chinese acad sci, shanghai inst opt & fine mech, natl lab high power laser & phys, shanghai 201800, peoples r china.
英文摘要	an accurate evaluation method with an amplified spontaneous emission (ase) as the irradiation source has been developed for testing thin-film damage threshold. the partial coherence of the ase source results in a very smooth beam profile in the near-field and a uniform intensity distribution of the focal spot in the far-field. ase is generated by an nd: glass rod amplifier in sg-ii high power laser facility, with pulse duration of 9 ns and spectral width (fwhm) of 1 nm. the damage threshold of the tio2 high reflection film is 14.4j/cm(2) using ase as the irradiation source, about twice of 7.4 j/cm(2) that tested by a laser source with the same pulse duration and central wavelength. the damage area induced by ase is small with small-scale desquamation and a few pits, corresponding to the defect distribution of samples. large area desquamation is observed in the area damaged by laser, as the main reason that the non-uniformity of the laser light. the ase damage threshold leads to more accurate evaluations of the samples damage probability by reducing the influence of hot spots in the irradiation beam. furthermore, the ase source has a great potential in the detection of the defect distribution of the optical elements.
收录类别	CPCI
会议录	laser-induced damage in optical materials: 2014
会议录出版者	spie-int soc optical engineering
语种	英语
内容类型	会议论文
源URL	[http://ir.siom.ac.cn/handle/181231/17170]
专题	上海光学精密机械研究所_高功率激光物理国家实验室
作者单位	1.[Zhou, Qiong 2.Sun, Mingying 3.Zhang, Zhixiang 4.Yao, Yudong 5.Peng, Yujie 6.Liu, Dean 7.Zhu, Jianqiang] Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Natl Lab High Power Laser & Phys, Shanghai 201800, Peoples R China
推荐引用方式 GB/T 7714	Zhou, Qiong,Sun, Mingying,Zhang, Zhixiang,et al. Evaluation Damage Threshold of Optical Thin-Film Using an Amplified Spontaneous Emission Source[C]. 见:spie laser damage - 46th annual symposium on optical materials for high power lasers.