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	Study of Scintillator thickness optimization of lens-coupled X-ray imaging detectors
	Xie, H; Du, G; Deng, B; Chen, R; Xiao, T
刊名	JOURNAL OF INSTRUMENTATION
	2016
卷号	11期号:-页码:—
关键词	COMPUTED MICROTOMOGRAPHY RESOLUTION
ISSN号	1748-0221
通讯作者	Xie, H (reprint author), Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai Synchrotron Radiat Facil, Zhangheng Rd 239, Shanghai 201204, Peoples R China.
英文摘要	Lens-coupled X-ray in-direct imaging detectors are very popular for high-resolution X-ray imaging at the third generation synchrotron radiation facilities. This imaging system consists of a scintilator producing a visible-light image of X-ray beam, a microscope objective, a mirror reflecting at 90 degrees and a CCD camera. When the thickness of the scintillator is matched with the numerical aperture (NA) of the microscope objective, the image quality of experimental results will be improved obviously. This paper used an imaging system at BL13W beamline of Shanghai Synchrotron Radiation Facility (SSRF) to study the matching relation between the scintillator thickness and the NA of the microscope objective with a real sample. By use of the matching relation between the scintillator thickness and the NA of the microscope objective, the optimal imaging results have been obtained.
收录类别	SCI
语种	英语
WOS记录号	WOS:000375746200058
内容类型	期刊论文
源URL	[http://ir.sinap.ac.cn/handle/331007/25850]
专题	上海应用物理研究所_中科院上海应用物理研究所2011-2017年
推荐引用方式 GB/T 7714	Xie, H,Du, G,Deng, B,et al. Study of Scintillator thickness optimization of lens-coupled X-ray imaging detectors[J]. JOURNAL OF INSTRUMENTATION,2016,11(-):—.
APA	Xie, H,Du, G,Deng, B,Chen, R,&Xiao, T.(2016).Study of Scintillator thickness optimization of lens-coupled X-ray imaging detectors.JOURNAL OF INSTRUMENTATION,11(-),—.
MLA	Xie, H,et al."Study of Scintillator thickness optimization of lens-coupled X-ray imaging detectors".JOURNAL OF INSTRUMENTATION 11.-(2016):—.

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