Development of defects detection in gluing glass
Zongming, Wu1,2; Wei, Yang1; Tianquan, Fan1
2012
会议名称Proceedings of SPIE: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes
会议日期2012
卷号8415
页码84150J
通讯作者Zongming, W.
中文摘要The defects engendering in the process of glass gluing are mainly flaws and delaminations which will reduce the stability and processing availability of the optical component. How to detect these defects has become a technical problem for a long time. Several Non-Destructive Test (NDT) methods such as ultrasonic C-scan, bubble tester and infrared thermography are effective in inspection of it at present. In this paper, these three techniques' detection principle, advantages and disadvantages are introduced. On the basis of detection demands, photothermal radiometry that it has become a powerful tool to detect subsurface defects in composites because of its non-contact and highly sensitivity is used to detect defects in the gluing process of glass for the first time. The basic idea that glass-layer transmits the spectrum and the spectrum energy is absorbed by glue-layer is also put forward creatively. By monitoring the temperature variation of glue-layer in time domain using infrared thermal imager, the defects can be discovered. © 2012 SPIE.
英文摘要The defects engendering in the process of glass gluing are mainly flaws and delaminations which will reduce the stability and processing availability of the optical component. How to detect these defects has become a technical problem for a long time. Several Non-Destructive Test (NDT) methods such as ultrasonic C-scan, bubble tester and infrared thermography are effective in inspection of it at present. In this paper, these three techniques' detection principle, advantages and disadvantages are introduced. On the basis of detection demands, photothermal radiometry that it has become a powerful tool to detect subsurface defects in composites because of its non-contact and highly sensitivity is used to detect defects in the gluing process of glass for the first time. The basic idea that glass-layer transmits the spectrum and the spectrum energy is absorbed by glue-layer is also put forward creatively. By monitoring the temperature variation of glue-layer in time domain using infrared thermal imager, the defects can be discovered. © 2012 SPIE.
收录类别EI
语种英语
ISSN号0277786X
内容类型会议论文
源URL[http://ir.ioe.ac.cn/handle/181551/7914]  
专题光电技术研究所_质量处(质检中心)
作者单位1.Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, China
2.Graduate University, Chinese Academy of Sciences, Beijing 10049, China
推荐引用方式
GB/T 7714
Zongming, Wu,Wei, Yang,Tianquan, Fan. Development of defects detection in gluing glass[C]. 见:Proceedings of SPIE: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes. 2012.
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