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	Analysis on the system error cause by lateral departure of the light source during Ronchi test
	Bai-ping Lei; Fan Wu
	2010
会议名称	Proceedings of the SPIE - The International Society for Optical Engineering
会议日期	2010
卷号	7656
页码	76563H (5 pp.)
通讯作者	Bai-ping Lei
中文摘要	The Ronchi test is very useful for the testing of large aperture astronomical optical element, and will be more useful with the achievement of testing in a quantitative way. While when it comes to application, the light source should has a certain extent lateral departure away from the optical axis so that the image of it is apart away form itself and can be captured. This lateral departure produces the system error in the measurement. By means of optical design software, this paper studies the system error of the Ronchi test produced by the lateral departure of light source on the base of the simulation and the calculation of error according to the different distances from the optical axis, and discusses the conditions satisfied with a certain measurement requires on the foundation of the outcome. Then a system device including the light source that can be used in the practice of the measurement is designed. This device also is very useful for the other testing methods that need a high power and large relative diameter light source.
英文摘要	The Ronchi test is very useful for the testing of large aperture astronomical optical element, and will be more useful with the achievement of testing in a quantitative way. While when it comes to application, the light source should has a certain extent lateral departure away from the optical axis so that the image of it is apart away form itself and can be captured. This lateral departure produces the system error in the measurement. By means of optical design software, this paper studies the system error of the Ronchi test produced by the lateral departure of light source on the base of the simulation and the calculation of error according to the different distances from the optical axis, and discusses the conditions satisfied with a certain measurement requires on the foundation of the outcome. Then a system device including the light source that can be used in the practice of the measurement is designed. This device also is very useful for the other testing methods that need a high power and large relative diameter light source.
收录类别	EI ; ISTP
语种	英语
内容类型	会议论文
源URL	[http://ir.ioe.ac.cn/handle/181551/7561]
专题	光电技术研究所_先光中心
作者单位	中国科学院光电技术研究所
推荐引用方式 GB/T 7714	Bai-ping Lei,Fan Wu. Analysis on the system error cause by lateral departure of the light source during Ronchi test[C]. 见:Proceedings of the SPIE - The International Society for Optical Engineering. 2010.

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