Retrace error reconstruction based on point characteristic function

	Retrace error reconstruction based on point characteristic function
	Yiwei, He 1,2; Hou, Xi 1; Haiyang, Quan 1,2; Song, Weihong 1
刊名	Optics Express
	2015
卷号	23 期号:22 页码:28216-28223
ISSN号	1094-4087
中文摘要	Figure measuring interferometers generally work in the null condition, i.e., the reference rays share the same optical path with the test rays through the imaging system. In this case, except field distortion error, effect of other aberrations cancels out and doesn't result in measureable systematic error. However, for spatial carrier interferometry and non-null aspheric test cases, null condition cannot be achieved typically, and there is excessive measurement error that is referenced as retrace error. Previous studies about retrace error can be generally distinguished into two categories: one based on 4th-order aberration formalism, the other based on ray tracing through interferometer model. In this paper, point characteristic function (PCF) is used to analyze retrace error in a Fizeau interferometer working in high spatial carrier condition. We present the process of reconstructing retrace error with and without element error in detail. Our results are in contrast with those obtained by ray tracing through interferometer model. The small difference between them (less than 3%) shows that our method is effective. ©2015 Optical Society of America.
英文摘要	Figure measuring interferometers generally work in the null condition, i.e., the reference rays share the same optical path with the test rays through the imaging system. In this case, except field distortion error, effect of other aberrations cancels out and doesn't result in measureable systematic error. However, for spatial carrier interferometry and non-null aspheric test cases, null condition cannot be achieved typically, and there is excessive measurement error that is referenced as retrace error. Previous studies about retrace error can be generally distinguished into two categories: one based on 4th-order aberration formalism, the other based on ray tracing through interferometer model. In this paper, point characteristic function (PCF) is used to analyze retrace error in a Fizeau interferometer working in high spatial carrier condition. We present the process of reconstructing retrace error with and without element error in detail. Our results are in contrast with those obtained by ray tracing through interferometer model. The small difference between them (less than 3%) shows that our method is effective. ©2015 Optical Society of America.
学科主题	Communication channels (information theory) - Interferometers - Laser optics - Ray tracing
收录类别	SCI ; EI
语种	英语
WOS记录号	WOS:000366578900012
内容类型	期刊论文
源URL	[http://ir.ioe.ac.cn/handle/181551/7050]
专题	光电技术研究所_先光中心
作者单位	1.Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, Sichuan, China 2.University of Chinese Academy of Sciences, Beijing, China
推荐引用方式 GB/T 7714	Yiwei, He,Hou, Xi,Haiyang, Quan,et al. Retrace error reconstruction based on point characteristic function[J]. Optics Express,2015,23(22):28216-28223.
APA	Yiwei, He,Hou, Xi,Haiyang, Quan,&Song, Weihong.(2015).Retrace error reconstruction based on point characteristic function.Optics Express,23(22),28216-28223.
MLA	Yiwei, He,et al."Retrace error reconstruction based on point characteristic function".Optics Express 23.22(2015):28216-28223.