Charge collection studies in irradiated HV-CMOS particle detectors

	Charge collection studies in irradiated HV-CMOS particle detectors
	CMOS Collaboration
刊名	JOURNAL OF INSTRUMENTATION
	2016
卷号	11
语种	英语
WOS记录号	WOS:000375746400026
内容类型	期刊论文
源URL	[http://ir.ihep.ac.cn/handle/311005/248201]
专题	高能物理研究所_加速器中心
推荐引用方式 GB/T 7714	CMOS Collaboration. Charge collection studies in irradiated HV-CMOS particle detectors[J]. JOURNAL OF INSTRUMENTATION,2016,11.
APA	CMOS Collaboration.(2016).Charge collection studies in irradiated HV-CMOS particle detectors.JOURNAL OF INSTRUMENTATION,11.
MLA	CMOS Collaboration."Charge collection studies in irradiated HV-CMOS particle detectors".JOURNAL OF INSTRUMENTATION 11(2016).