Hardness ratio estimation in low counting X-ray photometry

CORC > 高能物理研究所 > 中国科学院高能物理研究所 > 粒子天体物理中心

	Hardness ratio estimation in low counting X-ray photometry
	Jin, YK; Zhang SN(张双南); Zhang, SN; Wu, JF
刊名	ASTROPHYSICAL JOURNAL
	2006
卷号	653 期号:2 页码:1566-1570
关键词	methods : statistical X-rays : general X-rays : ISM
通讯作者	Tsing Hua Univ, Dept Engn Phys, Beijing 100084, Peoples R China ; Tsing Hua Univ, Ctr Astrophys, Beijing 100084, Peoples R China ; Tsing Hua Univ, Dept Phys, Beijing 100084, Peoples R China ; Chinese Acad Sci, Inst High Energy Phys, Key Lab Particle Astrophys, Beijing 100049, Peoples R China
英文摘要	Hardness ratios are commonly used in X-ray photometry to roughly indicate spectral properties. They are usually defined as the ratio of counts in two different wave bands. This definition, however, is problematic when the counts are very limited. Here we instead define the hardness ratio using the lambda-parameter of Poisson processes and develop an estimation method via Bayesian statistics. Our Monte Carlo simulations show the validity of our method. Based on this new definition we can estimate the hydrogen column density for the photoelectric absorption of X-ray spectra in the case of low counting statistics.
学科主题	Astronomy & Astrophysics
类目[WOS]	Astronomy & Astrophysics
研究领域[WOS]	Astronomy & Astrophysics
原文出处	SCI
语种	英语
WOS记录号	WOS:000242955200064
内容类型	期刊论文
源URL	[http://ir.ihep.ac.cn/handle/311005/239416]
专题	高能物理研究所_粒子天体物理中心高能物理研究所_实验物理中心
作者单位	中国科学院高能物理研究所
推荐引用方式 GB/T 7714	Jin, YK,Zhang SN,Zhang, SN,et al. Hardness ratio estimation in low counting X-ray photometry[J]. ASTROPHYSICAL JOURNAL,2006,653(2):1566-1570.
APA	Jin, YK,张双南,Zhang, SN,&Wu, JF.(2006).Hardness ratio estimation in low counting X-ray photometry.ASTROPHYSICAL JOURNAL,653(2),1566-1570.
MLA	Jin, YK,et al."Hardness ratio estimation in low counting X-ray photometry".ASTROPHYSICAL JOURNAL 653.2(2006):1566-1570.