Hardness ratio estimation in low counting X-ray photometry | |
Jin, YK; Zhang SN(张双南)![]() ![]() ![]() | |
刊名 | ASTROPHYSICAL JOURNAL
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2006 | |
卷号 | 653期号:2页码:1566-1570 |
关键词 | methods : statistical X-rays : general X-rays : ISM |
通讯作者 | Tsing Hua Univ, Dept Engn Phys, Beijing 100084, Peoples R China ; Tsing Hua Univ, Ctr Astrophys, Beijing 100084, Peoples R China ; Tsing Hua Univ, Dept Phys, Beijing 100084, Peoples R China ; Chinese Acad Sci, Inst High Energy Phys, Key Lab Particle Astrophys, Beijing 100049, Peoples R China |
英文摘要 | Hardness ratios are commonly used in X-ray photometry to roughly indicate spectral properties. They are usually defined as the ratio of counts in two different wave bands. This definition, however, is problematic when the counts are very limited. Here we instead define the hardness ratio using the lambda-parameter of Poisson processes and develop an estimation method via Bayesian statistics. Our Monte Carlo simulations show the validity of our method. Based on this new definition we can estimate the hydrogen column density for the photoelectric absorption of X-ray spectra in the case of low counting statistics. |
学科主题 | Astronomy & Astrophysics |
类目[WOS] | Astronomy & Astrophysics |
研究领域[WOS] | Astronomy & Astrophysics |
原文出处 | SCI |
语种 | 英语 |
WOS记录号 | WOS:000242955200064 |
内容类型 | 期刊论文 |
源URL | [http://ir.ihep.ac.cn/handle/311005/239416] ![]() |
专题 | 高能物理研究所_粒子天体物理中心 高能物理研究所_实验物理中心 |
作者单位 | 中国科学院高能物理研究所 |
推荐引用方式 GB/T 7714 | Jin, YK,Zhang SN,Zhang, SN,et al. Hardness ratio estimation in low counting X-ray photometry[J]. ASTROPHYSICAL JOURNAL,2006,653(2):1566-1570. |
APA | Jin, YK,张双南,Zhang, SN,&Wu, JF.(2006).Hardness ratio estimation in low counting X-ray photometry.ASTROPHYSICAL JOURNAL,653(2),1566-1570. |
MLA | Jin, YK,et al."Hardness ratio estimation in low counting X-ray photometry".ASTROPHYSICAL JOURNAL 653.2(2006):1566-1570. |
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