Interfacial structure of molecular beam epitaxial grown cubic-GaN films on GaAs(001) probed by x-ray gazing-angle specular reflection | |
Li, JH![]() ![]() ![]() ![]() ![]() | |
刊名 | APPLIED PHYSICS LETTERS
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1999 | |
卷号 | 74期号:20页码:2981-2983 |
通讯作者 | Chinese Acad Sci, Inst Phys, Beijing 100080, Peoples R China ; Chinese Acad Sci, Ctr Condensed Matter Phys, Beijing 100080, Peoples R China ; Chinese Acad Sci, Inst High Energy Phys, Beijing Synchrotron Rad Facil, Beijing 100039, Peoples R China |
英文摘要 | We report on a study of interfacial structure of GaN films grown on GaAs(001) substrates by plasma-assisted molecular beam epitaxy using x-ray grazing-angle specular reflection. We show that interfacial layers with electron densities differing from those of GaN and GaAs were formed upon deposition of GaN. It is also found that the interfacial structure of our systems depends strongly on the course of the initial layer deposition. The phase purity of the GaN films was examined by x-ray reciprocal space mapping. A simple kinetic growth model suggested by our results has been presented. (C) 1999 American Institute of Physics. [S0003-6951(99)01920-8]. |
学科主题 | Physics |
类目[WOS] | Physics, Applied |
研究领域[WOS] | Physics |
原文出处 | SCI |
语种 | 英语 |
WOS记录号 | WOS:000080352700025 |
内容类型 | 期刊论文 |
源URL | [http://ir.ihep.ac.cn/handle/311005/239852] ![]() |
专题 | 高能物理研究所_多学科研究中心 高能物理研究所_加速器中心 高能物理研究所_核技术应用研究中心 中国科学院高能物理研究所_人力资源处 中国科学院高能物理研究所_中国散裂中子源 |
作者单位 | 中国科学院高能物理研究所 |
推荐引用方式 GB/T 7714 | Li, JH,Chen, H,Cai, LC,et al. Interfacial structure of molecular beam epitaxial grown cubic-GaN films on GaAs(001) probed by x-ray gazing-angle specular reflection[J]. APPLIED PHYSICS LETTERS,1999,74(20):2981-2983. |
APA | Li, JH.,Chen, H.,Cai, LC.,Cui, SF.,Yu, WX.,...&贾全杰.(1999).Interfacial structure of molecular beam epitaxial grown cubic-GaN films on GaAs(001) probed by x-ray gazing-angle specular reflection.APPLIED PHYSICS LETTERS,74(20),2981-2983. |
MLA | Li, JH,et al."Interfacial structure of molecular beam epitaxial grown cubic-GaN films on GaAs(001) probed by x-ray gazing-angle specular reflection".APPLIED PHYSICS LETTERS 74.20(1999):2981-2983. |
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