Determination of interface layer thickness of a pseudo two-phase system by extension of the Debye equation

	Determination of interface layer thickness of a pseudo two-phase system by extension of the Debye equation
	Li, ZH; Gong, YJ; Pu, M; Wu, D; Sun, YH; Wang, J; Liu, Y; Dong, BZ; Wang J(王俊); Liu Y(柳义)
刊名	JOURNAL OF PHYSICS D-APPLIED PHYSICS
	2001
卷号	34 期号:14 页码:2085-2088
通讯作者	Chinese Acad Sci, Inst Coal Chem, State Key Lab Coal Convers, Taiyuan 030001, Peoples R China ; Chinese Acad Sci, Inst High Energy Phys, Synchrotron Radiat Lab, Beijing 100039, Peoples R China
英文摘要	The Debye equation with slit-smeared small angle x-ray scattering (SAXS) data is extended from an ideal two-phase system to a pseudo two-phase system with the presence of the interface layer, and a simple accurate solution is proposed to determine the average thickness of the interface layer in porous materials. This method is tested by experimental SAXS data, which were measured at 25 degreesC, of organo-modified mesoporous silica prepared by condensation of tetraethoxysilane (TEOS) and methyltriethoxysilane (MTES) using non-ionic neutral surfactant as template under neutral condition.
学科主题	Physics
类目[WOS]	Physics, Applied
研究领域[WOS]	Physics
原文出处	SCI
语种	英语
WOS记录号	WOS:000170361000003
内容类型	期刊论文
源URL	[http://ir.ihep.ac.cn/handle/311005/239647]
专题	高能物理研究所_多学科研究中心高能物理研究所_粒子天体物理中心
作者单位	中国科学院高能物理研究所
推荐引用方式 GB/T 7714	Li, ZH,Gong, YJ,Pu, M,et al. Determination of interface layer thickness of a pseudo two-phase system by extension of the Debye equation[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS,2001,34(14):2085-2088.
APA	Li, ZH.,Gong, YJ.,Pu, M.,Wu, D.,Sun, YH.,...&董宝中.(2001).Determination of interface layer thickness of a pseudo two-phase system by extension of the Debye equation.JOURNAL OF PHYSICS D-APPLIED PHYSICS,34(14),2085-2088.
MLA	Li, ZH,et al."Determination of interface layer thickness of a pseudo two-phase system by extension of the Debye equation".JOURNAL OF PHYSICS D-APPLIED PHYSICS 34.14(2001):2085-2088.