Synchrotron radiation study on structure of Sb delta-doped Si

	Synchrotron radiation study on structure of Sb delta-doped Si
	Xiu LS(修立松); Jiang XM(姜晓明); Zheng WL(郑文莉); Xiu, LS; Jiang, XM; Zheng, WL; Lu, XK; Jiang, ZM; Zhang, XJ; Wang, X
刊名	CHINESE SCIENCE BULLETIN
	1996
卷号	41 期号:7 页码:559-562
关键词	X-ray diffraction synchrotron radiation application delta-doped silicon
学科主题	Science & Technology - Other Topics
类目[WOS]	Multidisciplinary Sciences
研究领域[WOS]	Science & Technology - Other Topics
原文出处	SCI
语种	英语
WOS记录号	WOS:A1996UH89900009
内容类型	期刊论文
源URL	[http://ir.ihep.ac.cn/handle/311005/237955]
专题	高能物理研究所_多学科研究中心中国科学院高能物理研究所_人力资源处中国科学院高能物理研究所_中国散裂中子源
作者单位	中国科学院高能物理研究所
推荐引用方式 GB/T 7714	Xiu LS,Jiang XM,Zheng WL,et al. Synchrotron radiation study on structure of Sb delta-doped Si[J]. CHINESE SCIENCE BULLETIN,1996,41(7):559-562.
APA	修立松.,姜晓明.,郑文莉.,Xiu, LS.,Jiang, XM.,...&Wang, X.(1996).Synchrotron radiation study on structure of Sb delta-doped Si.CHINESE SCIENCE BULLETIN,41(7),559-562.
MLA	修立松,et al."Synchrotron radiation study on structure of Sb delta-doped Si".CHINESE SCIENCE BULLETIN 41.7(1996):559-562.