MOCVD growth of cubic GaN: Materials and devices
Zhao DG; Zhang SM
2000
会议名称international workshop on nitride semiconductors (iwn 2000)
会议日期sep 24-27, 2000
会议地点nagoya, japan
关键词MOCVD GaN InGaN cubic LED CHEMICAL-VAPOR-DEPOSITION MOLECULAR-BEAM EPITAXY GALLIUM NITRIDE PHASE EPITAXY INGAN FILMS ELECTROLUMINESCENCE ZINCBLENDE WURTZITE MBE
页码64-69
通讯作者yang h chinese acad sci inst semicond state key lab integrated optoelect natl res ctr optoelect beijing 100083 peoples r china.
中文摘要many impressive progresses have been made recently on the growth of cubic-phase gan by mbe and mocvd. in this paper, some of our recent progress will be reviewed, including the growth of high quality cubic ingan films, ingan/gan heterostructure blue and green leds. cubic-phase gan films were grown on gaas (100) substrates by mocvd. growth conditions were optimized to obtain pure cubic phase gan films up to a thickness of 4 mum. an anomalous compressive strain was found in the as-grown gan films in spite of a smaller lattice constant for gan compared with that of gaas substrates. the photoluminescence fwhm of high quality ingan epilayers was less than 100 mev the ingan/gan heterostructure blue led has intense electroluminescence with a fwhm of 20 nm.
英文摘要many impressive progresses have been made recently on the growth of cubic-phase gan by mbe and mocvd. in this paper, some of our recent progress will be reviewed, including the growth of high quality cubic ingan films, ingan/gan heterostructure blue and green leds. cubic-phase gan films were grown on gaas (100) substrates by mocvd. growth conditions were optimized to obtain pure cubic phase gan films up to a thickness of 4 mum. an anomalous compressive strain was found in the as-grown gan films in spite of a smaller lattice constant for gan compared with that of gaas substrates. the photoluminescence fwhm of high quality ingan epilayers was less than 100 mev the ingan/gan heterostructure blue led has intense electroluminescence with a fwhm of 20 nm.; 于2010-10-29批量导入; made available in dspace on 2010-10-29t06:36:51z (gmt). no. of bitstreams: 1 2882.pdf: 389364 bytes, checksum: 18fedc6e44df1c67e27f7649f4536f40 (md5) previous issue date: 2000; japan soc appl phys, solid state phys & applicat div.; japan soc promot sci, comm short wavelength optoelectr devices, 162.; japan soc promot sci, comm convers light & elect, 125.; chinese acad sci, inst semicond, state key lab integrated optoelect, natl res ctr optoelect, beijing 100083, peoples r china
收录类别CPCI-S
会议主办者japan soc appl phys, solid state phys & applicat div.; japan soc promot sci, comm short wavelength optoelectr devices, 162.; japan soc promot sci, comm convers light & elect, 125.
会议录proceedings of the international workshop on nitride semiconductors, 1
会议录出版者inst pure applied physics ; daini toyokaiji bldg 24-8 shinbashi 4 chome, tokyo, 105-0004, japan
会议录出版地daini toyokaiji bldg 24-8 shinbashi 4 chome, tokyo, 105-0004, japan
学科主题半导体材料
语种英语
ISBN号4-900526-13-4
内容类型会议论文
源URL[http://ir.semi.ac.cn/handle/172111/13709]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
推荐引用方式
GB/T 7714
Zhao DG,Zhang SM. MOCVD growth of cubic GaN: Materials and devices[C]. 见:international workshop on nitride semiconductors (iwn 2000). nagoya, japan. sep 24-27, 2000.
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