MOCVD growth of cubic GaN: Materials and devices | |
Zhao DG![]() ![]() | |
2000 | |
会议名称 | international workshop on nitride semiconductors (iwn 2000) |
会议日期 | sep 24-27, 2000 |
会议地点 | nagoya, japan |
关键词 | MOCVD GaN InGaN cubic LED CHEMICAL-VAPOR-DEPOSITION MOLECULAR-BEAM EPITAXY GALLIUM NITRIDE PHASE EPITAXY INGAN FILMS ELECTROLUMINESCENCE ZINCBLENDE WURTZITE MBE |
页码 | 64-69 |
通讯作者 | yang h chinese acad sci inst semicond state key lab integrated optoelect natl res ctr optoelect beijing 100083 peoples r china. |
中文摘要 | many impressive progresses have been made recently on the growth of cubic-phase gan by mbe and mocvd. in this paper, some of our recent progress will be reviewed, including the growth of high quality cubic ingan films, ingan/gan heterostructure blue and green leds. cubic-phase gan films were grown on gaas (100) substrates by mocvd. growth conditions were optimized to obtain pure cubic phase gan films up to a thickness of 4 mum. an anomalous compressive strain was found in the as-grown gan films in spite of a smaller lattice constant for gan compared with that of gaas substrates. the photoluminescence fwhm of high quality ingan epilayers was less than 100 mev the ingan/gan heterostructure blue led has intense electroluminescence with a fwhm of 20 nm. |
英文摘要 | many impressive progresses have been made recently on the growth of cubic-phase gan by mbe and mocvd. in this paper, some of our recent progress will be reviewed, including the growth of high quality cubic ingan films, ingan/gan heterostructure blue and green leds. cubic-phase gan films were grown on gaas (100) substrates by mocvd. growth conditions were optimized to obtain pure cubic phase gan films up to a thickness of 4 mum. an anomalous compressive strain was found in the as-grown gan films in spite of a smaller lattice constant for gan compared with that of gaas substrates. the photoluminescence fwhm of high quality ingan epilayers was less than 100 mev the ingan/gan heterostructure blue led has intense electroluminescence with a fwhm of 20 nm.; 于2010-10-29批量导入; made available in dspace on 2010-10-29t06:36:51z (gmt). no. of bitstreams: 1 2882.pdf: 389364 bytes, checksum: 18fedc6e44df1c67e27f7649f4536f40 (md5) previous issue date: 2000; japan soc appl phys, solid state phys & applicat div.; japan soc promot sci, comm short wavelength optoelectr devices, 162.; japan soc promot sci, comm convers light & elect, 125.; chinese acad sci, inst semicond, state key lab integrated optoelect, natl res ctr optoelect, beijing 100083, peoples r china |
收录类别 | CPCI-S |
会议主办者 | japan soc appl phys, solid state phys & applicat div.; japan soc promot sci, comm short wavelength optoelectr devices, 162.; japan soc promot sci, comm convers light & elect, 125. |
会议录 | proceedings of the international workshop on nitride semiconductors, 1
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会议录出版者 | inst pure applied physics ; daini toyokaiji bldg 24-8 shinbashi 4 chome, tokyo, 105-0004, japan |
会议录出版地 | daini toyokaiji bldg 24-8 shinbashi 4 chome, tokyo, 105-0004, japan |
学科主题 | 半导体材料 |
语种 | 英语 |
ISBN号 | 4-900526-13-4 |
内容类型 | 会议论文 |
源URL | [http://ir.semi.ac.cn/handle/172111/13709] ![]() |
专题 | 半导体研究所_中国科学院半导体研究所(2009年前) |
推荐引用方式 GB/T 7714 | Zhao DG,Zhang SM. MOCVD growth of cubic GaN: Materials and devices[C]. 见:international workshop on nitride semiconductors (iwn 2000). nagoya, japan. sep 24-27, 2000. |
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