Scan test in 18x8 bits Booth Coding-Wallace Tree multiplier | |
Wang DH ; Ruan J ; Li YG ; Hou CH | |
2001 | |
会议名称 | 4th international conference on asic |
会议日期 | oct 23-25, 2001 |
会议地点 | shanghai, peoples r china |
页码 | 624-627 |
通讯作者 | wang dh chinese acad sci inst semicond pob 912 beijing 100083 peoples r china. |
中文摘要 | scan test can be inserted around hard ip cores that have not been designed with dft approaches. an 18x18 bits booth coding-wallace tree multiplier has been designed with full custom approach with 0.61 m cmos technology. when we reuse the multiplier in another chip, scan chain has been inserted around it to increase the fault coverage. after scan insertion, the multiplier needs 4.7% more areas and 24.4% more delay time, while the fault coverage reaches to 95%. |
英文摘要 | scan test can be inserted around hard ip cores that have not been designed with dft approaches. an 18x18 bits booth coding-wallace tree multiplier has been designed with full custom approach with 0.61 m cmos technology. when we reuse the multiplier in another chip, scan chain has been inserted around it to increase the fault coverage. after scan insertion, the multiplier needs 4.7% more areas and 24.4% more delay time, while the fault coverage reaches to 95%.; 于2010-10-29批量导入; made available in dspace on 2010-10-29t06:36:42z (gmt). no. of bitstreams: 1 2855.pdf: 289302 bytes, checksum: 4da55ab7897301577c15ad20bc548b26 (md5) previous issue date: 2001; chinese inst electr.; ieee beijing sect.; natl nat sci fdn china.; shanghai municipal sci & technol commiss.; chinese acad sci, inst semicond, beijing 100083, peoples r china |
收录类别 | CPCI-S |
会议主办者 | chinese inst electr.; ieee beijing sect.; natl nat sci fdn china.; shanghai municipal sci & technol commiss. |
会议录 | 2001 4th international conference on asic proceedings
![]() |
会议录出版者 | ieee ; 345 e 47th st, new york, ny 10017 usa |
会议录出版地 | 345 e 47th st, new york, ny 10017 usa |
学科主题 | 微电子学 |
语种 | 英语 |
ISBN号 | 0-7803-6677-8 |
内容类型 | 会议论文 |
源URL | [http://ir.semi.ac.cn/handle/172111/13687] ![]() |
专题 | 半导体研究所_中国科学院半导体研究所(2009年前) |
推荐引用方式 GB/T 7714 | Wang DH,Ruan J,Li YG,et al. Scan test in 18x8 bits Booth Coding-Wallace Tree multiplier[C]. 见:4th international conference on asic. shanghai, peoples r china. oct 23-25, 2001. |
个性服务 |
查看访问统计 |
相关权益政策 |
暂无数据 |
收藏/分享 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论