Scan test in 18x8 bits Booth Coding-Wallace Tree multiplier

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	Scan test in 18x8 bits Booth Coding-Wallace Tree multiplier
	Wang DH ; Ruan J ; Li YG ; Hou CH
	2001
会议名称	4th international conference on asic
会议日期	oct 23-25, 2001
会议地点	shanghai, peoples r china
页码	624-627
通讯作者	wang dh chinese acad sci inst semicond pob 912 beijing 100083 peoples r china.
中文摘要	scan test can be inserted around hard ip cores that have not been designed with dft approaches. an 18x18 bits booth coding-wallace tree multiplier has been designed with full custom approach with 0.61 m cmos technology. when we reuse the multiplier in another chip, scan chain has been inserted around it to increase the fault coverage. after scan insertion, the multiplier needs 4.7% more areas and 24.4% more delay time, while the fault coverage reaches to 95%.
英文摘要	scan test can be inserted around hard ip cores that have not been designed with dft approaches. an 18x18 bits booth coding-wallace tree multiplier has been designed with full custom approach with 0.61 m cmos technology. when we reuse the multiplier in another chip, scan chain has been inserted around it to increase the fault coverage. after scan insertion, the multiplier needs 4.7% more areas and 24.4% more delay time, while the fault coverage reaches to 95%.; 于2010-10-29批量导入; made available in dspace on 2010-10-29t06:36:42z (gmt). no. of bitstreams: 1 2855.pdf: 289302 bytes, checksum: 4da55ab7897301577c15ad20bc548b26 (md5) previous issue date: 2001; chinese inst electr.; ieee beijing sect.; natl nat sci fdn china.; shanghai municipal sci & technol commiss.; chinese acad sci, inst semicond, beijing 100083, peoples r china
收录类别	CPCI-S
会议主办者	chinese inst electr.; ieee beijing sect.; natl nat sci fdn china.; shanghai municipal sci & technol commiss.
会议录	2001 4th international conference on asic proceedings
会议录出版者	ieee ; 345 e 47th st, new york, ny 10017 usa
会议录出版地	345 e 47th st, new york, ny 10017 usa
学科主题	微电子学
语种	英语
ISBN号	0-7803-6677-8
内容类型	会议论文
源URL	[http://ir.semi.ac.cn/handle/172111/13687]
专题	半导体研究所_中国科学院半导体研究所（2009年前）
推荐引用方式 GB/T 7714	Wang DH,Ruan J,Li YG,et al. Scan test in 18x8 bits Booth Coding-Wallace Tree multiplier[C]. 见:4th international conference on asic. shanghai, peoples r china. oct 23-25, 2001.