Two-port calibration of test fixtures with OSL method.

CORC > 半导体研究所 > 中国科学院半导体研究所 > 中国科学院半导体研究所（2009年前）

	Two-port calibration of test fixtures with OSL method.
	Chen ZY ; Wang YL ; Liu Y ; Zhu NH
	2002
会议名称	3rd international conference on microwave and millimeter wave technology
会议日期	aug 17-19, 2002
会议地点	beijing, peoples r china
关键词	calibration microwave network analyzer scattering-parameter measurement phase uncertainty NETWORK-ANALYZER CALIBRATION LINE
页码	138-141
通讯作者	chen zy cas inst semicond state key lab integrated optoelect beijing 100083 peoples r china.
中文摘要	the open-short-load (osl) method is very simple and widely used, for one-port test fixture calibration. in this paper, this method. is extended to the two-port calibration of test fixtures for the first time. the problem of phase uncertainty arising in this application has been solved. the comparison between our results and those obtained with the short-open-load-thru (solt) method shows that the method established is accurate enough for practical applications.
英文摘要	the open-short-load (osl) method is very simple and widely used, for one-port test fixture calibration. in this paper, this method. is extended to the two-port calibration of test fixtures for the first time. the problem of phase uncertainty arising in this application has been solved. the comparison between our results and those obtained with the short-open-load-thru (solt) method shows that the method established is accurate enough for practical applications.; 于2010-10-29批量导入; made available in dspace on 2010-10-29t06:36:25z (gmt). no. of bitstreams: 1 2793.pdf: 217670 bytes, checksum: 2d582a13ed488ca5a6b0f11a7ba11583 (md5) previous issue date: 2002; chinese inst electr.; ieee microwave theory & techn soc.; ieee electron devices soc.; iee antennas & propagat soc.; electr soc, inst electr, informat & commun engineers japan.; korea inst telemat & electr.; ieee beijing sect.; iee beijing ctr.; ieee mtt s beijing chapter.; cas, inst semicond, state key lab integrated optoelect, beijing 100083, peoples r china
收录类别	CPCI-S
会议主办者	chinese inst electr.; ieee microwave theory & techn soc.; ieee electron devices soc.; iee antennas & propagat soc.; electr soc, inst electr, informat & commun engineers japan.; korea inst telemat & electr.; ieee beijing sect.; iee beijing ctr.; ieee mtt s beijing chapter.
会议录	2002 3rd international conference on microwave and millimeter wave technology proceedings
会议录出版者	ieee ; 345 e 47th st, new york, ny 10017 usa
会议录出版地	345 e 47th st, new york, ny 10017 usa
学科主题	光电子学
语种	英语
ISBN号	0-7803-7486-x
内容类型	会议论文
源URL	[http://ir.semi.ac.cn/handle/172111/13607]
专题	半导体研究所_中国科学院半导体研究所（2009年前）
推荐引用方式 GB/T 7714	Chen ZY,Wang YL,Liu Y,et al. Two-port calibration of test fixtures with OSL method.[C]. 见:3rd international conference on microwave and millimeter wave technology. beijing, peoples r china. aug 17-19, 2002.