Optical and structural characteristics of high indium content InGaN/GaN multi-quantum wells with varying GaN cap layer thickness
Yang, J; Zhao, DG; Jiang, DS; Chen, P; Zhu, JJ; Liu, ZS; Le, LC; Li, XJ; He, XG; Liu, JP(刘建平)
刊名JOURNAL OF APPLIED PHYSICS
2015
卷号117期号:5页码:6
通讯作者Zhao, DG
英文摘要The optical and structural properties of InGaN/GaN multi-quantum wells (MQWs) with different thicknesses of low temperature grown GaN cap layers are investigated. It is found that the MQW emission energy red-shifts and the peak intensity decreases with increasing GaN cap layer thickness, which may be partly caused by increased floating indium atoms accumulated at quantum well (QW) surface. They will result in the increased interface roughness, higher defect density, and even lead to a thermal degradation of QW layers. An extra growth interruption introduced before the growth of GaN cap layer can help with evaporating the floating indium atoms, and therefore is an effective method to improve the optical properties of high indium content InGaN/GaN MQWs. (C) 2015 AIP Publishing LLC.
收录类别SCI
语种英语
公开日期2016-05-03
内容类型期刊论文
源URL[http://ir.sinano.ac.cn/handle/332007/3433]  
专题苏州纳米技术与纳米仿生研究所_纳米器件及相关材料研究部_刘建平团队
推荐引用方式
GB/T 7714
Yang, J,Zhao, DG,Jiang, DS,et al. Optical and structural characteristics of high indium content InGaN/GaN multi-quantum wells with varying GaN cap layer thickness[J]. JOURNAL OF APPLIED PHYSICS,2015,117(5):6.
APA Yang, J.,Zhao, DG.,Jiang, DS.,Chen, P.,Zhu, JJ.,...&Du, GT.(2015).Optical and structural characteristics of high indium content InGaN/GaN multi-quantum wells with varying GaN cap layer thickness.JOURNAL OF APPLIED PHYSICS,117(5),6.
MLA Yang, J,et al."Optical and structural characteristics of high indium content InGaN/GaN multi-quantum wells with varying GaN cap layer thickness".JOURNAL OF APPLIED PHYSICS 117.5(2015):6.
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