Suructural investigation of InGaAs/InP quantum wire array using triple-axis X-ray diffractometry

	Suructural investigation of InGaAs/InP quantum wire array using triple-axis X-ray diffractometry
	Wang W(王圩); Jiang DS(江德生); Ma WQ(马文全); Wang YT(王玉田); Zhu HL(朱洪亮)
刊名	半导体学报
	1998
卷号	19 期号:1 页码:61
学科主题	光电子学
收录类别	CSCD
语种	中文
公开日期	2010-11-23
内容类型	期刊论文
源URL	[http://ir.semi.ac.cn/handle/172111/19213]
专题	半导体研究所_中国科学院半导体研究所（2009年前）
推荐引用方式 GB/T 7714	Wang W,Jiang DS,Ma WQ,et al. Suructural investigation of InGaAs/InP quantum wire array using triple-axis X-ray diffractometry[J]. 半导体学报,1998,19(1):61.
APA	王圩,江德生,马文全,王玉田,&朱洪亮.(1998).Suructural investigation of InGaAs/InP quantum wire array using triple-axis X-ray diffractometry.半导体学报,19(1),61.
MLA	王圩,et al."Suructural investigation of InGaAs/InP quantum wire array using triple-axis X-ray diffractometry".半导体学报 19.1(1998):61.