High Precision Standard Testing System for DCCT | |
陈斌(加); Chen SY(陈素颖); Cheng J(程建); Zhang J(张旌); Chen, B; Chen, SY; Cheng, J; Zhang, J | |
刊名 | CHINESE PHYSICS C |
2008 | |
卷号 | 32期号:1页码:#REF! |
关键词 | DC current measuring system DCCT testing system high precision stabilized DC power supply |
其他题名 | 高精度直流传感器DCCT标准测试系统 |
通讯作者 | Chen, B (reprint author), CAS, Inst High Energy Phys, Beijing 100049, Peoples R China. |
英文摘要 | In the BEPC II, a great deal of DCCTs, with current output, axe used as the measuring and feed-back units in power supplies. High Precision Standard Testing System for DCCT is designed and developed in order to detect and adjust the capability of DCCT. This testing system mainly consists of a PC computer, a 71/2 Digit Multimeter, a high precision DC current measuring system, and a high precision and stability power supply. The function and the structure of the testing system are simply analysed, and the test data are presented. |
学科主题 | Physics |
类目[WOS] | Physics, Nuclear ; Physics, Particles & Fields |
收录类别 | SCI |
WOS记录号 | WOS:000255855900014 |
公开日期 | 2016-05-03 |
内容类型 | 期刊论文 |
源URL | [http://ir.ihep.ac.cn/handle/311005/225701] |
专题 | 高能物理研究所_加速器中心 |
推荐引用方式 GB/T 7714 | Chen B,Chen SY,Cheng J,et al. High Precision Standard Testing System for DCCT[J]. CHINESE PHYSICS C,2008,32(1):#REF!. |
APA | 陈斌.,陈素颖.,程建.,张旌.,Chen, B.,...&Zhang, J.(2008).High Precision Standard Testing System for DCCT.CHINESE PHYSICS C,32(1),#REF!. |
MLA | 陈斌,et al."High Precision Standard Testing System for DCCT".CHINESE PHYSICS C 32.1(2008):#REF!. |
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