Study of the microstructures and the strain of PbZr0.53Ti0.47O3/La1.85Sr0.15CuO4 integrated films

	Study of the microstructures and the strain of PbZr0.53Ti0.47O3/La1.85Sr0.15CuO4 integrated films
	Yu, WX; Cui, SF; Li, JH; Wu, LS; Mai, ZH; Liu, BT; Zhao, BR; Zheng, WL; Jia, QJ; Zheng WL(郑文莉)
刊名	PHYSICA C
	2000
卷号	337 期号:1-4 页码:#REF!
关键词	PbZr0.53Ti0.47O3/La1.85Sr0.15CuO4 SrTiO3 films
通讯作者	Yu, WX (reprint author), Jilin Univ, Dept Mat Sci, Changchun 130023, Peoples R China.
英文摘要	A series of PbZr0.53Ti0.47O3 (PZT)/La1.85Sr0.15CuO4 (LSCO) integrated films were grown on SrTiO3 (STO)(001) substrates by DC/RF magnetron sputtering method. The film thickness of the PZT changes from 500 to 9000 Angstrom, while that of the LSCO is kept at 1000 Angstrom. The microstructures of interface and surface of the bilayer film have been investigated by small-angle X-ray reflection, high-resolution X-ray diffraction (XRD) using synchrotron radiation, scanning electron microscopy (SEM) and transmission electron microscopy (TEM). The SEM images show island-like growth of the PZT layers with the particle size changing from 0.1 to 0.4 mu m, while the thickness of the PZT layer increased from 500 to 9000 Angstrom. The Full width at half maximums (FWHMs) of diffraction peak of the PZT layers are dramatically larger than that of LSCO layers, and the internal strains of the PZT layers are larger than that of LSCO films by an order. This indicated that the crystal perfection of the LSCO layers are better compared with PZT layers, and we attribute this to the different growth molds for PZT and LSCO films. However, no grand strain transition layers were found either in the PZT/LSCO or in the LSCO/PZT interfaces. (C) 2000 Elsevier Science B.V. All rights reserved.
学科主题	Physics
类目[WOS]	Physics, Applied
收录类别	SCI
WOS记录号	WOS:000088686400007
公开日期	2016-05-03
内容类型	期刊论文
源URL	[http://ir.ihep.ac.cn/handle/311005/225676]
专题	高能物理研究所_多学科研究中心中国科学院高能物理研究所_人力资源处
推荐引用方式 GB/T 7714	Yu, WX,Cui, SF,Li, JH,et al. Study of the microstructures and the strain of PbZr0.53Ti0.47O3/La1.85Sr0.15CuO4 integrated films[J]. PHYSICA C,2000,337(1-4):#REF!.
APA	Yu, WX.,Cui, SF.,Li, JH.,Wu, LS.,Mai, ZH.,...&贾全杰.(2000).Study of the microstructures and the strain of PbZr0.53Ti0.47O3/La1.85Sr0.15CuO4 integrated films.PHYSICA C,337(1-4),#REF!.
MLA	Yu, WX,et al."Study of the microstructures and the strain of PbZr0.53Ti0.47O3/La1.85Sr0.15CuO4 integrated films".PHYSICA C 337.1-4(2000):#REF!.