A Radial Stub Test Circuit for Microwave Power Devices

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	A Radial Stub Test Circuit for Microwave Power Devices
	Luo Weijun ; Chen Xiaojuan ; Liang Xiaoxin ; Ma Xiaolin ; Liu Xinyu ; Wang Xiaoliang
刊名	半导体学报
	2006
卷号	27 期号:9 页码:1557-1561
中文摘要	with the principles of microwave circuits and semiconductor device physics, two microwave power device test circuits combined with a test fixture are designed and simulated, whose properties are evaluated by a parameter network analyzer within the frequency range from 3 to 8ghz. the simulation and experimental results verify that the test circuit with a radial stub is better than that without. as an example, a c-band algan/gan hemt microwave power device is tested with the designed circuit and fixture. with a 5.4ghz microwave input signal, the maximum gain is 8.75db, and the maximum output power is 33.2dbm.
学科主题	半导体材料
收录类别	CSCD
资助信息	国家重点基础研究发展计划,中国科学院重点计划资助项目
语种	英语
公开日期	2010-11-23
内容类型	期刊论文
源URL	[http://ir.semi.ac.cn/handle/172111/16599]
专题	半导体研究所_中国科学院半导体研究所（2009年前）
推荐引用方式 GB/T 7714	Luo Weijun,Chen Xiaojuan,Liang Xiaoxin,et al. A Radial Stub Test Circuit for Microwave Power Devices[J]. 半导体学报,2006,27(9):1557-1561.
APA	Luo Weijun,Chen Xiaojuan,Liang Xiaoxin,Ma Xiaolin,Liu Xinyu,&Wang Xiaoliang.(2006).A Radial Stub Test Circuit for Microwave Power Devices.半导体学报,27(9),1557-1561.
MLA	Luo Weijun,et al."A Radial Stub Test Circuit for Microwave Power Devices".半导体学报 27.9(2006):1557-1561.