INVESTIGATION OF C-60 SINGLE-CRYSTAL BY X-RAY-METHODS

CORC > 半导体研究所 > 中国科学院半导体研究所 > 中国科学院半导体研究所（2009年前）

	INVESTIGATION OF C-60 SINGLE-CRYSTAL BY X-RAY-METHODS
	LI CR ; MAI ZH ; WANG G ; WANG YT ; WU LS ; CUI SF ; XIE SS ; JIANG JH
刊名	chinese physics letters
	1995
卷号	12 期号:4 页码:217-220
关键词	CONDUCTIVITY
ISSN号	0256-307x
通讯作者	li cr acad sinicainst physpob 603beijing 100080peoples r china.
中文摘要	c-60 single crystals grown by a single-temperature-gradient technique were characterized by synchrotron radiation white beam x-ray topography and x-ray double crystal diffraction with cu k-alpha 1 radiation on conventional x-ray source. the results show that the crystal is rather well crystallized, the x-ray topographies give an evidence of dendritic growth mechanism of c-60 single crystal, and x-ray double crystal diffraction rocking curve shows that there are mosaic structural defects in the sample. a phase transition st 249+/-1.5% k from a simple cubic to a face centered cubic structure is confirmed by in situ observation of synchrotron radiation white beam x-ray topography with the temperature varing from 230 to 295 k.
学科主题	半导体物理
收录类别	SCI
语种	英语
公开日期	2010-11-17
内容类型	期刊论文
源URL	[http://ir.semi.ac.cn/handle/172111/15481]
专题	半导体研究所_中国科学院半导体研究所（2009年前）
推荐引用方式 GB/T 7714	LI CR,MAI ZH,WANG G,et al. INVESTIGATION OF C-60 SINGLE-CRYSTAL BY X-RAY-METHODS[J]. chinese physics letters,1995,12(4):217-220.
APA	LI CR.,MAI ZH.,WANG G.,WANG YT.,WU LS.,...&JIANG JH.(1995).INVESTIGATION OF C-60 SINGLE-CRYSTAL BY X-RAY-METHODS.chinese physics letters,12(4),217-220.
MLA	LI CR,et al."INVESTIGATION OF C-60 SINGLE-CRYSTAL BY X-RAY-METHODS".chinese physics letters 12.4(1995):217-220.