INVESTIGATION OF C-60 SINGLE-CRYSTAL BY X-RAY-METHODS | |
LI CR ; MAI ZH ; WANG G ; WANG YT ; WU LS ; CUI SF ; XIE SS ; JIANG JH | |
刊名 | chinese physics letters
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1995 | |
卷号 | 12期号:4页码:217-220 |
关键词 | CONDUCTIVITY |
ISSN号 | 0256-307x |
通讯作者 | li cr acad sinicainst physpob 603beijing 100080peoples r china. |
中文摘要 | c-60 single crystals grown by a single-temperature-gradient technique were characterized by synchrotron radiation white beam x-ray topography and x-ray double crystal diffraction with cu k-alpha 1 radiation on conventional x-ray source. the results show that the crystal is rather well crystallized, the x-ray topographies give an evidence of dendritic growth mechanism of c-60 single crystal, and x-ray double crystal diffraction rocking curve shows that there are mosaic structural defects in the sample. a phase transition st 249+/-1.5% k from a simple cubic to a face centered cubic structure is confirmed by in situ observation of synchrotron radiation white beam x-ray topography with the temperature varing from 230 to 295 k. |
学科主题 | 半导体物理 |
收录类别 | SCI |
语种 | 英语 |
公开日期 | 2010-11-17 |
内容类型 | 期刊论文 |
源URL | [http://ir.semi.ac.cn/handle/172111/15481] ![]() |
专题 | 半导体研究所_中国科学院半导体研究所(2009年前) |
推荐引用方式 GB/T 7714 | LI CR,MAI ZH,WANG G,et al. INVESTIGATION OF C-60 SINGLE-CRYSTAL BY X-RAY-METHODS[J]. chinese physics letters,1995,12(4):217-220. |
APA | LI CR.,MAI ZH.,WANG G.,WANG YT.,WU LS.,...&JIANG JH.(1995).INVESTIGATION OF C-60 SINGLE-CRYSTAL BY X-RAY-METHODS.chinese physics letters,12(4),217-220. |
MLA | LI CR,et al."INVESTIGATION OF C-60 SINGLE-CRYSTAL BY X-RAY-METHODS".chinese physics letters 12.4(1995):217-220. |
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